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Title: Identification of an organic semiconductor superlattice structure of pentacene and perfluoro-pentacene through resonant and non-resonant X-ray scattering

Highly crystalline and stable molecular superlattices are grown with the smallest possible stacking period using monolayers (MLs) of the organic semiconductors pentacene (PEN) and perfluoro-pentacene (PFP). Superlattice reflections in X-ray reflectivity and their energy dependence in resonant soft X-ray reflectivity measurements show that PFP and PEN MLs indeed alternate even though the coherent ordering is lost after ~ 4 ML. The observed lattice spacing of 15.9 Å in the superlattice is larger than in pure PEN and PFP films, presumably because of more upright standing molecules and lack of interdigitation between the incommensurate crystalline PEN and PFP layers. The findings are important for the development of novel organic quantum optoelectronic devices.
 [1] ;  [2] ;  [3] ;  [1] ;  [2] ;  [3] ;  [4] ;  [2]
  1. Humboldt Univ. of Berlin (Germany)
  2. Univ. Tuebingen, Tuebingen (Germany)
  3. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Advanced Light Source (ALS)
  4. Univ. of California, Berkeley, CA (United States). Dept. of Physics and Dept. of Chemistry
Publication Date:
Grant/Contract Number:
Accepted Manuscript
Journal Name:
AIP Advances
Additional Journal Information:
Journal Volume: 5; Journal Issue: 11; Journal ID: ISSN 2158-3226
American Institute of Physics (AIP)
Research Org:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Org:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22); German research foundation (DFG)
Country of Publication:
United States
36 MATERIALS SCIENCE; Superlattices; Thin film structure; Semiconductor growth; Crystal structure; Reflectivity
OSTI Identifier: