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This content will become publicly available on July 10, 2018

Title: Interfacial Thermal Conductance between Mechanically Exfoliated Black Phosphorus and SiO x: Effect of Thickness and Temperature

Authors:
 [1] ;  [1] ;  [1] ;  [2] ;  [1] ; ORCiD logo [1]
  1. Department of Mechanical Engineering, Iowa State University, 2025 Black Engineering Building Ames IA 50010 USA
  2. Automotive Engineering College, Shanghai University of Engineering Science, 333 Longteng Road Shanghai 201620 P. R. China
Publication Date:
Grant/Contract Number:
NE0000671; EE0007686
Type:
Publisher's Accepted Manuscript
Journal Name:
Advanced Materials Interfaces
Additional Journal Information:
Journal Volume: 4; Journal Issue: 16; Related Information: CHORUS Timestamp: 2017-10-20 15:52:41; Journal ID: ISSN 2196-7350
Publisher:
Wiley-VCH
Sponsoring Org:
USDOE
Country of Publication:
Germany
Language:
English
OSTI Identifier:
1376746