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Title: Temperature-induced local and average structural changes in BaTiO 3- xBi(Zn 1/2Ti 1/2)O 3 solid solutions: The origin of high temperature dielectric permittivity

The existence of local tetragonal distortions is evidenced in the BaTiO 3–xBi(Zn 1/2Ti 1/2)O 3 (BT–xBZT) relaxor dielectric material system at elevated temperatures. The local and average structures of BT-xBZT with different compositions are characterized using in situ high temperature total scattering techniques. Using the box-car fitting method, it is inferred that there are tetragonal polar clusters embedded in a non-polar pseudocubic matrix for BT-xBZT relaxors. The diameter of these polar clusters is estimated as 2–3 nm at room temperature. Sequential temperature series fitting shows the persistence of the tetragonal distortion on the local scale, while the average structure transforms to a pseudocubic paraelectric phase at high temperatures. The fundamental origin of the temperature stable permittivity of BT-xBZT and the relationship with the unique local scale structures are discussed. This systematic structural study of the BT-xBZT system provides both insight into the nature of lead-free perovskite relaxors, and advances the development of a wide range of electronics with reliable high temperature performance.
Authors:
ORCiD logo [1] ; ORCiD logo [2] ;  [1] ;  [3] ;  [4] ; ORCiD logo [5] ; ORCiD logo [6] ;  [1]
  1. North Carolina State Univ., Raleigh, NC (United States)
  2. North Carolina State Univ., Raleigh, NC (United States); Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
  3. Oregon State Univ., Corvallis, OR (United States); Chulalongkorn Univ., Bangkok (Thailand)
  4. Oregon State Univ., Corvallis, OR (United States); Silpakorn Univ., Nakornpathom (Thailand)
  5. Oregon State Univ., Corvallis, OR (United States)
  6. Univ. of Leeds, Leeds (United Kingdom)
Publication Date:
Grant/Contract Number:
AC05-00OR22725; AC02-06CH11357
Type:
Accepted Manuscript
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Volume: 122; Journal Issue: 6; Journal ID: ISSN 0021-8979
Publisher:
American Institute of Physics (AIP)
Research Org:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Org:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE
OSTI Identifier:
1376492
Alternate Identifier(s):
OSTI ID: 1374784

Hou, Dong, Usher, Tedi -Marie, Zhou, Hanhan, Raengthon, Natthaphon, Triamnak, Narit, Cann, David P., Forrester, Jennifer S., and Jones, Jacob L.. Temperature-induced local and average structural changes in BaTiO3-xBi(Zn 1/2Ti1/2)O3 solid solutions: The origin of high temperature dielectric permittivity. United States: N. p., Web. doi:10.1063/1.4989393.
Hou, Dong, Usher, Tedi -Marie, Zhou, Hanhan, Raengthon, Natthaphon, Triamnak, Narit, Cann, David P., Forrester, Jennifer S., & Jones, Jacob L.. Temperature-induced local and average structural changes in BaTiO3-xBi(Zn 1/2Ti1/2)O3 solid solutions: The origin of high temperature dielectric permittivity. United States. doi:10.1063/1.4989393.
Hou, Dong, Usher, Tedi -Marie, Zhou, Hanhan, Raengthon, Natthaphon, Triamnak, Narit, Cann, David P., Forrester, Jennifer S., and Jones, Jacob L.. 2017. "Temperature-induced local and average structural changes in BaTiO3-xBi(Zn 1/2Ti1/2)O3 solid solutions: The origin of high temperature dielectric permittivity". United States. doi:10.1063/1.4989393. https://www.osti.gov/servlets/purl/1376492.
@article{osti_1376492,
title = {Temperature-induced local and average structural changes in BaTiO3-xBi(Zn 1/2Ti1/2)O3 solid solutions: The origin of high temperature dielectric permittivity},
author = {Hou, Dong and Usher, Tedi -Marie and Zhou, Hanhan and Raengthon, Natthaphon and Triamnak, Narit and Cann, David P. and Forrester, Jennifer S. and Jones, Jacob L.},
abstractNote = {The existence of local tetragonal distortions is evidenced in the BaTiO3–xBi(Zn1/2Ti1/2)O3 (BT–xBZT) relaxor dielectric material system at elevated temperatures. The local and average structures of BT-xBZT with different compositions are characterized using in situ high temperature total scattering techniques. Using the box-car fitting method, it is inferred that there are tetragonal polar clusters embedded in a non-polar pseudocubic matrix for BT-xBZT relaxors. The diameter of these polar clusters is estimated as 2–3 nm at room temperature. Sequential temperature series fitting shows the persistence of the tetragonal distortion on the local scale, while the average structure transforms to a pseudocubic paraelectric phase at high temperatures. The fundamental origin of the temperature stable permittivity of BT-xBZT and the relationship with the unique local scale structures are discussed. This systematic structural study of the BT-xBZT system provides both insight into the nature of lead-free perovskite relaxors, and advances the development of a wide range of electronics with reliable high temperature performance.},
doi = {10.1063/1.4989393},
journal = {Journal of Applied Physics},
number = 6,
volume = 122,
place = {United States},
year = {2017},
month = {8}
}

Works referenced in this record:

Rapid-acquisition pair distribution function (RA-PDF) analysis
journal, November 2003
  • Chupas, Peter J.; Qiu, Xiangyun; Hanson, Jonathan C.
  • Journal of Applied Crystallography, Vol. 36, Issue 6, p. 1342-1347
  • DOI: 10.1107/S0021889803017564