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This content will become publicly available on August 14, 2018

Title: Analysis of InGaN nanodots grown by droplet heteroepitaxy using grazing incidence small-angle X-ray scattering and electron microscopy

Authors:
ORCiD logo [1] ;  [2] ;  [3] ;  [4]
  1. Department of Electrical and Computer Engineering, Boston University, Boston, Massachusetts 02215, USA, Photonics Center, Boston University, Boston, Massachusetts 02215, USA
  2. Photonics Center, Boston University, Boston, Massachusetts 02215, USA
  3. Physics Department, Boston University, Boston, Massachusetts 02215, USA
  4. Department of Electrical and Computer Engineering, Boston University, Boston, Massachusetts 02215, USA, Photonics Center, Boston University, Boston, Massachusetts 02215, USA, Division of Materials Science and Engineering, Boston University, Boston, Massachusetts 02215, USA
Publication Date:
Grant/Contract Number:
FG02-06ER46332
Type:
Publisher's Accepted Manuscript
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Volume: 122; Journal Issue: 6; Related Information: CHORUS Timestamp: 2018-02-14 19:37:54; Journal ID: ISSN 0021-8979
Publisher:
American Institute of Physics
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
OSTI Identifier:
1374928