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Title: Double-shot MeV electron diffraction and microscopy

Here in this paper, we study by numerical simulations a time-resolved MeV electron scattering mode where two consecutive electron pulses are used to capture the evolution of a material sample on 10 ps time scales. The two electron pulses are generated by illuminating a photocathode in a radiofrequency photogun by two short laser pulses with adjustable delay. A streak camera/deflecting cavity is used after the sample to project the two electron bunches on two well separated regions of the detector screen. By using sufficiently short pulses, the 2D spatial information from each snapshot can be preserved. This “double-shot” technique enables the efficient capture of irreversible dynamics in both diffraction and imaging modes. Finally, in this work, we demonstrate both modes in start-to-end simulations of the UCLA Pegasus MeV microscope column.
 [1] ;  [1] ;  [1]
  1. Univ. of California, Los Angeles, CA (United States). Dept. of Physics and Astronomy
Publication Date:
Grant/Contract Number:
SC0013115; DMR 1548924
Accepted Manuscript
Journal Name:
Structural Dynamics
Additional Journal Information:
Journal Volume: 4; Journal Issue: 4; Journal ID: ISSN 2329-7778
American Crystallographic Association/AIP
Research Org:
Radiabeam Technologies, LLC, Santa Monica, CA (United States)
Sponsoring Org:
USDOE Office of Science (SC); National Science Foundation (NSF)
Country of Publication:
United States
36 MATERIALS SCIENCE; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; Image sensors; Electron scattering; Electron beams; Time resolved imaging; Spatial resolution
OSTI Identifier: