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This content will become publicly available on June 5, 2018

Title: Determining and Controlling the Magnesium Composition in CdTe/CdMgTe Heterostructures

The relationships between Mg composition, band gap, and lattice characteristics are investigated for Cd 1-xMg xTe barrier layers using a combination of cathodoluminescence, energy dispersive x-ray spectroscopy, variable angle spectral ellipsometry, and atom probe tomography. The use of a simplified, yet accurate, variable angle spectral ellipsometry analysis is shown to be appropriate for fast determination of composition in thin Cd 1-xMg xTe layers. The validity of using high-resolution x-ray diffraction for CdTe/Cd 1-xMg xTe double heterostructures is discussed. Furthermore, the stability of CdTe/Cd 1-xMg xTe heterostructures are investigated with respect to thermal processing.
Authors:
 [1] ;  [1] ;  [1] ;  [1] ;  [1] ;  [1] ;  [1] ;  [2] ;  [2] ;  [2] ;  [3] ;  [4] ;  [1]
  1. Texas State Univ., San Marcos, TX (United States)
  2. Colorado School of Mines, Golden, CO (United States)
  3. EAG Laboratories (Evans Analytical Group), Sunnyvale, CA (United States)
  4. National Renewable Energy Lab. (NREL), Golden, CO (United States)
Publication Date:
Report Number(s):
NREL/JA-5K00-68890
Journal ID: ISSN 0361-5235
Grant/Contract Number:
AC36-08GO28308
Type:
Accepted Manuscript
Journal Name:
Journal of Electronic Materials
Additional Journal Information:
Journal Volume: 46; Journal Issue: 9; Journal ID: ISSN 0361-5235
Publisher:
Springer
Research Org:
National Renewable Energy Lab. (NREL), Golden, CO (United States)
Sponsoring Org:
USDOE Office of Energy Efficiency and Renewable Energy (EERE)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; II-VI semiconductor materials; semiconductor epitaxial layers; Mg composition; band gap; elastic constants; diffusivity
OSTI Identifier:
1374127