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Title: Quantitative analysis of total reflection X-ray fluorescence from finely layered structures using XeRay

Authors:
 [1] ;  [2] ;  [1] ;  [1] ;  [3] ; ORCiD logo [1] ;  [1] ;  [4] ; ORCiD logo [5] ;  [6]
  1. James Franck Institute, The University of Chicago, Chicago, Illinois 60637, USA, Department of Chemistry, The University of Chicago, Chicago, Illinois 60637, USA
  2. Program in the Biophysical Sciences, Institute for Biophysical Dynamics, The University of Chicago, Chicago, Illinois 60637, USA
  3. The College, The University of Chicago, Chicago, Illinois 60637, USA
  4. James Franck Institute, The University of Chicago, Chicago, Illinois 60637, USA, Center for Advanced Radiation Sources, The University of Chicago, Chicago, Illinois 60637, USA
  5. Center for Advanced Radiation Sources, The University of Chicago, Chicago, Illinois 60637, USA
  6. James Franck Institute, The University of Chicago, Chicago, Illinois 60637, USA, Department of Chemistry, The University of Chicago, Chicago, Illinois 60637, USA, Center for Advanced Radiation Sources, The University of Chicago, Chicago, Illinois 60637, USA
Publication Date:
Grant/Contract Number:
AC02-06CH11357
Type:
Publisher's Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 88; Journal Issue: 3; Related Information: CHORUS Timestamp: 2018-02-14 20:06:34; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
OSTI Identifier:
1373959