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Title: Quantitative analysis of total reflection X-ray fluorescence from finely layered structures using XeRay

Authors:
 [1] ;  [2] ;  [1] ;  [1] ;  [3] ; ORCiD logo [1] ;  [1] ;  [4] ; ORCiD logo [5] ;  [6]
  1. James Franck Institute, The University of Chicago, Chicago, Illinois 60637, USA, Department of Chemistry, The University of Chicago, Chicago, Illinois 60637, USA
  2. Program in the Biophysical Sciences, Institute for Biophysical Dynamics, The University of Chicago, Chicago, Illinois 60637, USA
  3. The College, The University of Chicago, Chicago, Illinois 60637, USA
  4. James Franck Institute, The University of Chicago, Chicago, Illinois 60637, USA, Center for Advanced Radiation Sources, The University of Chicago, Chicago, Illinois 60637, USA
  5. Center for Advanced Radiation Sources, The University of Chicago, Chicago, Illinois 60637, USA
  6. James Franck Institute, The University of Chicago, Chicago, Illinois 60637, USA, Department of Chemistry, The University of Chicago, Chicago, Illinois 60637, USA, Center for Advanced Radiation Sources, The University of Chicago, Chicago, Illinois 60637, USA
Publication Date:
Grant/Contract Number:
AC02-06CH11357
Type:
Publisher's Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Name: Review of Scientific Instruments Journal Volume: 88 Journal Issue: 3; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
OSTI Identifier:
1373959

Gong, Zhiliang, Kerr, Daniel, Hwang, Hyeondo Luke, Henderson, J. Michael, Suwatthee, Tiffany, Slaw, Benjamin R., Cao, Kathleen D., Lin, Binhua, Bu, Wei, and Lee, Ka Yee C.. Quantitative analysis of total reflection X-ray fluorescence from finely layered structures using XeRay. United States: N. p., Web. doi:10.1063/1.4978654.
Gong, Zhiliang, Kerr, Daniel, Hwang, Hyeondo Luke, Henderson, J. Michael, Suwatthee, Tiffany, Slaw, Benjamin R., Cao, Kathleen D., Lin, Binhua, Bu, Wei, & Lee, Ka Yee C.. Quantitative analysis of total reflection X-ray fluorescence from finely layered structures using XeRay. United States. doi:10.1063/1.4978654.
Gong, Zhiliang, Kerr, Daniel, Hwang, Hyeondo Luke, Henderson, J. Michael, Suwatthee, Tiffany, Slaw, Benjamin R., Cao, Kathleen D., Lin, Binhua, Bu, Wei, and Lee, Ka Yee C.. 2017. "Quantitative analysis of total reflection X-ray fluorescence from finely layered structures using XeRay". United States. doi:10.1063/1.4978654.
@article{osti_1373959,
title = {Quantitative analysis of total reflection X-ray fluorescence from finely layered structures using XeRay},
author = {Gong, Zhiliang and Kerr, Daniel and Hwang, Hyeondo Luke and Henderson, J. Michael and Suwatthee, Tiffany and Slaw, Benjamin R. and Cao, Kathleen D. and Lin, Binhua and Bu, Wei and Lee, Ka Yee C.},
abstractNote = {},
doi = {10.1063/1.4978654},
journal = {Review of Scientific Instruments},
number = 3,
volume = 88,
place = {United States},
year = {2017},
month = {3}
}