Structure and chemistry of epitaxial ceria thin films on yttria-stabilized zirconia substrates, studied by high resolution electron microscopy

Sinclair, Robert; Lee, Sang Chul; Shi, Yezhou; Chueh, William C.

doi:10.1016/j.ultramic.2017.03.015

Title: Structure and chemistry of epitaxial ceria thin films on yttria-stabilized zirconia substrates, studied by high resolution electron microscopy

Abstract

Here, we have applied aberration-corrected transmission electron microscopy (TEM) imaging and electron energy loss spectroscopy (EELS) to study the structure and chemistry of epitaxial ceria thin films, grown by pulsed laser deposition onto (001) yttria-stabilized zirconia (YSZ) substrates. There are few observable defects apart from the expected mismatch interfacial dislocations and so the films would be expected to have good potential for applications. Under high electron beam dose rate (above about 6000 e-/Å²s) domains of an ordered structure appear and these are interpreted as being created by oxygen vacancy ordering. The ordered structure does not appear at lower lose rates (ca. 2600 e-/Å²s) and can be removed by imaging under 1 mbar oxygen gas in an environmental TEM. EELS confirms that there is both oxygen deficiency and the associated increase in Ce³⁺ versus Ce⁴⁺ cations in the ordered domains. In situ high resolution TEM recordings show the formation of the ordered domains as well as atomic migration along the ceria thin film (001) surface.

Authors:: Sinclair, Robert; Lee, Sang Chul; Shi, Yezhou; Chueh, William C.

Publication Date:: Mon May 01 00:00:00 EDT 2017

Research Org.:: SLAC National Accelerator Lab., Menlo Park, CA (United States)

Sponsoring Org.:: USDOE Office of Science (SC)

OSTI Identifier:: 1389084

Alternate Identifier(s):: OSTI ID: 1373122

Grant/Contract Number:: AC02-76SF00515

Resource Type:: Published Article

Journal Name:: Ultramicroscopy

Additional Journal Information:: Journal Name: Ultramicroscopy Journal Volume: 176 Journal Issue: C; Journal ID: ISSN 0304-3991

Publisher:: Elsevier

Country of Publication:: Netherlands

Language:: English

Subject:: 37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY; 36 MATERIALS SCIENCE; aberration-corrected TEM; environmental TEM; electron energy loss spectroscopy; in situ high resolution electron microscopy; epitaxial ceria thin films; yttria-stabilized zirconia substrates

Citation Formats


                    Sinclair, Robert, Lee, Sang Chul, Shi, Yezhou, and Chueh, William C. Structure and chemistry of epitaxial ceria thin films on yttria-stabilized zirconia substrates, studied by high resolution electron microscopy.  Netherlands: N. p., 2017. 
Web.  doi:10.1016/j.ultramic.2017.03.015.

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                    Sinclair, Robert, Lee, Sang Chul, Shi, Yezhou, & Chueh, William C. Structure and chemistry of epitaxial ceria thin films on yttria-stabilized zirconia substrates, studied by high resolution electron microscopy.  Netherlands.  https://doi.org/10.1016/j.ultramic.2017.03.015

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                    Sinclair, Robert, Lee, Sang Chul, Shi, Yezhou, and Chueh, William C. Mon .  
"Structure and chemistry of epitaxial ceria thin films on yttria-stabilized zirconia substrates, studied by high resolution electron microscopy".  Netherlands.  https://doi.org/10.1016/j.ultramic.2017.03.015.

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@article{osti_1389084,

  title        = {Structure and chemistry of epitaxial ceria thin films on yttria-stabilized zirconia substrates, studied by high resolution electron microscopy},

  author       = {Sinclair, Robert and Lee, Sang Chul and Shi, Yezhou and Chueh, William C.},

  abstractNote = {Here, we have applied aberration-corrected transmission electron microscopy (TEM) imaging and electron energy loss spectroscopy (EELS) to study the structure and chemistry of epitaxial ceria thin films, grown by pulsed laser deposition onto (001) yttria-stabilized zirconia (YSZ) substrates. There are few observable defects apart from the expected mismatch interfacial dislocations and so the films would be expected to have good potential for applications. Under high electron beam dose rate (above about 6000 e-/Å2s) domains of an ordered structure appear and these are interpreted as being created by oxygen vacancy ordering. The ordered structure does not appear at lower lose rates (ca. 2600 e-/Å2s) and can be removed by imaging under 1 mbar oxygen gas in an environmental TEM. EELS confirms that there is both oxygen deficiency and the associated increase in Ce3+ versus Ce4+ cations in the ordered domains. In situ high resolution TEM recordings show the formation of the ordered domains as well as atomic migration along the ceria thin film (001) surface.},

  doi          = {10.1016/j.ultramic.2017.03.015},

  journal      = {Ultramicroscopy},

  number       = C,

  volume       = 176,

  place        = {Netherlands},

  year         = {Mon May 01 00:00:00 EDT 2017},

  month        = {Mon May 01 00:00:00 EDT 2017}

}

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Approaches to Exploring Spatio-Temporal Surface Dynamics in Nanoparticles with In Situ Transmission Electron Microscopy
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DOI: 10.1017/s1431927619015228

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Title: Structure and chemistry of epitaxial ceria thin films on yttria-stabilized zirconia substrates, studied by high resolution electron microscopy

Abstract

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Approaches to Exploring Spatio-Temporal Surface Dynamics in Nanoparticles with In Situ Transmission Electron Microscopy journal, December 2019

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