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Title: Effects of biaxial strain on the improper multiferroicity in h – LuFe O 3 films studied using the restrained thermal expansion method

Abstract

Elastic strain is potentially an important approach in tuning the properties of the improperly multiferroic hexagonal ferrites, the details of which have however been elusive due to the experimental difficulties. Employing the method of restrained thermal expansion, we have studied the effect of isothermal biaxial strain in the basal plane of h-LuFeO3 (001) films. The results indicate that a compressive biaxial strain significantly enhances the K3 structural distortion (the order parameter of the improper ferroelectricity), and the effect is larger at higher temperatures. The compressive biaxial strain and the enhanced K3 structural distortion together, cause an increase in the electric polarization and a reduction in the canting of the weak ferromagnetic moments in h-LuFeO3, according to our first principle calculations. These findings are important for understanding the strain effect as well as the coupling between the lattice and the improper multiferroicity in h-LuFeO3. Finally, the experimental elucidation of the strain effect in h-LuFeO3 films also suggests that the restrained thermal expansion can be a viable method to unravel the strain effect in many other thin film materials.

Authors:
 [1];  [2];  [1];  [2];  [3];  [4];  [5];  [5];  [6];  [6];  [5];  [5];  [3];  [2];  [1]
+ Show Author Affiliations
  1. Univ. of Nebraska, Lincoln, NE (United States)
  2. Temple Univ., Philadelphia, PA (United States)
  3. Bryn Mawr College, Bryn Mawr, PA (United States)
  4. Univ. of Nebraska, Lincoln, NE (United States); Xi'an Jiaotong Univ., Xi'an (China)
  5. Argonne National Lab. (ANL), Argonne, IL (United States)
  6. Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
National Science Foundation (NSF); National Institutes of Health (NIH); USDOE Office of Science (SC), Basic Energy Sciences (BES)
OSTI Identifier:
1372396
Alternate Identifier(s):
OSTI ID: 1347045
Grant/Contract Number:  
AC02-06CH11357
Resource Type:
Accepted Manuscript
Journal Name:
Physical Review B
Additional Journal Information:
Journal Volume: 95; Journal Issue: 9; Journal ID: ISSN 2469-9950
Publisher:
American Physical Society (APS)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Sinha, Kishan, Zhang, Yubo, Jiang, Xuanyuan, Wang, Hongwei, Wang, Xiao, Zhang, Xiaozhe, Ryan, Philip J., Kim, Jong -Woo, Bowlan, John, Yarotski, Dmitry A., Li, Yuelin, DiChiara, Anthony D., Cheng, Xuemei, Wu, Xifan, and Xu, Xiaoshan. Effects of biaxial strain on the improper multiferroicity in h–LuFeO3 films studied using the restrained thermal expansion method. United States: N. p., 2017. Web. doi:10.1103/PhysRevB.95.094110.
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Sinha, Kishan, Zhang, Yubo, Jiang, Xuanyuan, Wang, Hongwei, Wang, Xiao, Zhang, Xiaozhe, Ryan, Philip J., Kim, Jong -Woo, Bowlan, John, Yarotski, Dmitry A., Li, Yuelin, DiChiara, Anthony D., Cheng, Xuemei, Wu, Xifan, & Xu, Xiaoshan. Effects of biaxial strain on the improper multiferroicity in h–LuFeO3 films studied using the restrained thermal expansion method. United States. https://doi.org/10.1103/PhysRevB.95.094110
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Sinha, Kishan, Zhang, Yubo, Jiang, Xuanyuan, Wang, Hongwei, Wang, Xiao, Zhang, Xiaozhe, Ryan, Philip J., Kim, Jong -Woo, Bowlan, John, Yarotski, Dmitry A., Li, Yuelin, DiChiara, Anthony D., Cheng, Xuemei, Wu, Xifan, and Xu, Xiaoshan. Tue . "Effects of biaxial strain on the improper multiferroicity in h–LuFeO3 films studied using the restrained thermal expansion method". United States. https://doi.org/10.1103/PhysRevB.95.094110. https://www.osti.gov/servlets/purl/1372396.
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@article{osti_1372396,
title = {Effects of biaxial strain on the improper multiferroicity in h–LuFeO3 films studied using the restrained thermal expansion method},
author = {Sinha, Kishan and Zhang, Yubo and Jiang, Xuanyuan and Wang, Hongwei and Wang, Xiao and Zhang, Xiaozhe and Ryan, Philip J. and Kim, Jong -Woo and Bowlan, John and Yarotski, Dmitry A. and Li, Yuelin and DiChiara, Anthony D. and Cheng, Xuemei and Wu, Xifan and Xu, Xiaoshan},
abstractNote = {Elastic strain is potentially an important approach in tuning the properties of the improperly multiferroic hexagonal ferrites, the details of which have however been elusive due to the experimental difficulties. Employing the method of restrained thermal expansion, we have studied the effect of isothermal biaxial strain in the basal plane of h-LuFeO3 (001) films. The results indicate that a compressive biaxial strain significantly enhances the K3 structural distortion (the order parameter of the improper ferroelectricity), and the effect is larger at higher temperatures. The compressive biaxial strain and the enhanced K3 structural distortion together, cause an increase in the electric polarization and a reduction in the canting of the weak ferromagnetic moments in h-LuFeO3, according to our first principle calculations. These findings are important for understanding the strain effect as well as the coupling between the lattice and the improper multiferroicity in h-LuFeO3. Finally, the experimental elucidation of the strain effect in h-LuFeO3 films also suggests that the restrained thermal expansion can be a viable method to unravel the strain effect in many other thin film materials.},
doi = {10.1103/PhysRevB.95.094110},
journal = {Physical Review B},
number = 9,
volume = 95,
place = {United States},
year = {2017},
month = {3}
}
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https://doi.org/10.1103/PhysRevB.95.094110
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    Works referencing / citing this record:

    Structural studies and physical properties of hexagonal-YbFeO 3 thin films
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    Electronic structure and direct observation of ferrimagnetism in multiferroic hexagonal YbFeO 3
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