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Title: Monitoring Volumetric Changes in Silicon Thin-Film Anodes through In Situ Optical Diffraction Microscopy

Abstract

A high-resolution in situ spectroelectrochemical optical diffraction experiment has been created to understand the volume expansion/contraction process of amorphous silicon (a-Si) thin-film anodes. Electrodes consisting of 1D transmissive gratings of silicon have been produced through photolithographic methods. After glovebox assembly in a home-built Teflon cell, monitoring of the diffraction efficiency of these gratings during the lithiation/delithiation process is performed using an optical microscope equipped with a Bertrand lens. When the diffraction efficiency along with optical constants obtained from in situ spectroscopic ellipsometry is utilized, volume changes of the active materials can be deduced. Unlike transmission electron microscopy and atomic force microscopy characterization methods of observing silicon’s volume expansion, this experiment allows for real-time monitoring of the volume change at charge/discharge cycles greater than just the first few along with an experimental environment that directly mimics that of a real battery. This technique reflects promising results that provide needed insight into understanding the lithium alloying reaction and subsequent induced capacity fade during the cycling of alloying anodes in lithium-ion batteries.

Authors:
 [1];  [1];  [1];  [2]
+ Show Author Affiliations
  1. Univ. of Texas, Austin, TX (United States)
  2. Univ. of Texas, Austin, TX (United States); Skolkovo Inst. of Science and Technology, Moscow (Russia)
Publication Date:
Research Org.:
Energy Frontier Research Centers (EFRC) (United States). Understanding Charge Separation and Transfer at Interfaces in Energy Materials (CST)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
OSTI Identifier:
1370052
Grant/Contract Number:  
SC0001091
Resource Type:
Accepted Manuscript
Journal Name:
ACS Applied Materials and Interfaces
Additional Journal Information:
Journal Volume: 8; Journal Issue: 27; Related Information: CST partners with University of Texas at Austin (lead); Sandia National Laboratories; Journal ID: ISSN 1944-8244
Publisher:
American Chemical Society (ACS)
Country of Publication:
United States
Language:
English
Subject:
25 ENERGY STORAGE; silicon anode; lithium-ion batteries; optical diffraction; refractive index; volume expansion; spectroscopic ellipsometry; amorphous silicon; transmissive grating

Citation Formats

Duay, Jonathon, Schroder, Kjell W., Murugesan, Sankaran, and Stevenson, Keith J. Monitoring Volumetric Changes in Silicon Thin-Film Anodes through In Situ Optical Diffraction Microscopy. United States: N. p., 2016. Web. doi:10.1021/acsami.6b03822.
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Duay, Jonathon, Schroder, Kjell W., Murugesan, Sankaran, & Stevenson, Keith J. Monitoring Volumetric Changes in Silicon Thin-Film Anodes through In Situ Optical Diffraction Microscopy. United States. https://doi.org/10.1021/acsami.6b03822
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Duay, Jonathon, Schroder, Kjell W., Murugesan, Sankaran, and Stevenson, Keith J. Thu . "Monitoring Volumetric Changes in Silicon Thin-Film Anodes through In Situ Optical Diffraction Microscopy". United States. https://doi.org/10.1021/acsami.6b03822. https://www.osti.gov/servlets/purl/1370052.
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@article{osti_1370052,
title = {Monitoring Volumetric Changes in Silicon Thin-Film Anodes through In Situ Optical Diffraction Microscopy},
author = {Duay, Jonathon and Schroder, Kjell W. and Murugesan, Sankaran and Stevenson, Keith J.},
abstractNote = {A high-resolution in situ spectroelectrochemical optical diffraction experiment has been created to understand the volume expansion/contraction process of amorphous silicon (a-Si) thin-film anodes. Electrodes consisting of 1D transmissive gratings of silicon have been produced through photolithographic methods. After glovebox assembly in a home-built Teflon cell, monitoring of the diffraction efficiency of these gratings during the lithiation/delithiation process is performed using an optical microscope equipped with a Bertrand lens. When the diffraction efficiency along with optical constants obtained from in situ spectroscopic ellipsometry is utilized, volume changes of the active materials can be deduced. Unlike transmission electron microscopy and atomic force microscopy characterization methods of observing silicon’s volume expansion, this experiment allows for real-time monitoring of the volume change at charge/discharge cycles greater than just the first few along with an experimental environment that directly mimics that of a real battery. This technique reflects promising results that provide needed insight into understanding the lithium alloying reaction and subsequent induced capacity fade during the cycling of alloying anodes in lithium-ion batteries.},
doi = {10.1021/acsami.6b03822},
journal = {ACS Applied Materials and Interfaces},
number = 27,
volume = 8,
place = {United States},
year = {Thu Jun 16 00:00:00 EDT 2016},
month = {Thu Jun 16 00:00:00 EDT 2016}
}
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https://doi.org/10.1021/acsami.6b03822
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    Works referencing / citing this record:

    In situ and Operando Tracking of Microstructure and Volume Evolution of Silicon Electrodes by using Synchrotron X‐ray Imaging
    journal, October 2018

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