skip to main content
DOE PAGES title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Visibility of dielectrically passivated graphene films

; ; ; ; ; ORCiD logo
Publication Date:
Sponsoring Org.:
OSTI Identifier:
Grant/Contract Number:  
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Optics Letters
Additional Journal Information:
Journal Name: Optics Letters Journal Volume: 42 Journal Issue: 14; Journal ID: ISSN 0146-9592
Optical Society of America (OSA)
Country of Publication:
United States

Citation Formats

Ruiz, Isaac, Goldflam, Michael D., Beechem, Thomas E., Mcdonald, Anthony E., Draper, Bruce L., and Howell, Stephen W. Visibility of dielectrically passivated graphene films. United States: N. p., 2017. Web. doi:10.1364/OL.42.002850.
Ruiz, Isaac, Goldflam, Michael D., Beechem, Thomas E., Mcdonald, Anthony E., Draper, Bruce L., & Howell, Stephen W. Visibility of dielectrically passivated graphene films. United States. doi:10.1364/OL.42.002850.
Ruiz, Isaac, Goldflam, Michael D., Beechem, Thomas E., Mcdonald, Anthony E., Draper, Bruce L., and Howell, Stephen W. Fri . "Visibility of dielectrically passivated graphene films". United States. doi:10.1364/OL.42.002850.
title = {Visibility of dielectrically passivated graphene films},
author = {Ruiz, Isaac and Goldflam, Michael D. and Beechem, Thomas E. and Mcdonald, Anthony E. and Draper, Bruce L. and Howell, Stephen W.},
abstractNote = {},
doi = {10.1364/OL.42.002850},
journal = {Optics Letters},
number = 14,
volume = 42,
place = {United States},
year = {2017},
month = {7}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1364/OL.42.002850

Save / Share:

Works referenced in this record:

Graphene transfer with reduced residue
journal, September 2013

Simple Approach for High-Contrast Optical Imaging and Characterization of Graphene-Based Sheets
journal, December 2007

  • Jung, Inhwa; Pelton, Matthew; Piner, Richard
  • Nano Letters, Vol. 7, Issue 12
  • DOI: 10.1021/nl0714177

The Optical Visibility of Graphene:  Interference Colors of Ultrathin Graphite on SiO 2
journal, September 2007

  • Roddaro, S.; Pingue, P.; Piazza, V.
  • Nano Letters, Vol. 7, Issue 9
  • DOI: 10.1021/nl071158l

Dielectric functions and optical parameters of Si, Ge, GaP, GaAs, GaSb, InP, InAs, and InSb from 1.5 to 6.0 eV
journal, January 1983

Inch Scale High Throughput Metrology of Graphene and Graphene Oxide
journal, June 2014

  • Pleskot, Dennis; Mutlu, Zafer; Bell, Jeffrey
  • Nano Communications, Vol. 1, Issue 1
  • DOI: 10.1166/nano.2014.1008

Reconstruction of optical images of graphene-based materials coated on dielectric substrates
journal, February 2013

Making graphene visible
journal, August 2007

  • Blake, P.; Hill, E. W.; Castro Neto, A. H.
  • Applied Physics Letters, Vol. 91, Issue 6
  • DOI: 10.1063/1.2768624

Electronic color charts for dielectric films on silicon
journal, January 2004

  • Henrie, Justin; Kellis, Spencer; Schultz, Stephen M.
  • Optics Express, Vol. 12, Issue 7
  • DOI: 10.1364/OPEX.12.001464

Effects of semiconductor processing chemicals on conductivity of graphene
journal, July 2012

  • Chen, Chung Wei; Ren, F.; Chi, Gou-Chung
  • Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena, Vol. 30, Issue 4
  • DOI: 10.1116/1.4732517

Silicon Nitride Gate Dielectrics and Band Gap Engineering in Graphene Layers
journal, September 2010

  • Zhu, Wenjuan; Neumayer, Deborah; Perebeinos, Vasili
  • Nano Letters, Vol. 10, Issue 9
  • DOI: 10.1021/nl101832y

Optical properties of graphene
journal, October 2008

Optical Properties of Silicon Nitride
journal, January 1973

  • Philipp, Herbert R.
  • Journal of The Electrochemical Society, Vol. 120, Issue 2
  • DOI: 10.1149/1.2403440

Practical Chemical Sensors from Chemically Derived Graphene
journal, February 2009

  • Fowler, Jesse D.; Allen, Matthew J.; Tung, Vincent C.
  • ACS Nano, Vol. 3, Issue 2, p. 301-306
  • DOI: 10.1021/nn800593m

Conformal Al2O3 dielectric layer deposited by atomic layer deposition for graphene-based nanoelectronics
journal, May 2008

  • Lee, Bongki; Park, Seong-Yong; Kim, Hyun-Chul
  • Applied Physics Letters, Vol. 92, Issue 20
  • DOI: 10.1063/1.2928228

Graphene Thickness Determination Using Reflection and Contrast Spectroscopy
journal, September 2007

  • Ni, Z. H.; Wang, H. M.; Kasim, J.
  • Nano Letters, Vol. 7, Issue 9
  • DOI: 10.1021/nl071254m

Clean Transfer of Graphene for Isolation and Suspension
journal, February 2011

  • Lin, Yung-Chang; Jin, Chuanhong; Lee, Jung-Chi
  • ACS Nano, Vol. 5, Issue 3
  • DOI: 10.1021/nn200105j

Refractive index determination of SiO_2 layer in the UV/Vis/NIR range: spectrophotometric reverse engineering on single and bi-layer designs
journal, January 2013

  • Gao, L.; Lemarchand, F.; Lequime, M.
  • Journal of the European Optical Society: Rapid Publications, Vol. 8
  • DOI: 10.2971/jeos.2013.13010

Single-layer graphene on Al 2 O 3 /Si substrate: better contrast and higher performance of graphene transistors
journal, November 2009

Optimizing the identification of mono- and bilayer graphene on multilayer substrates
journal, January 2012

  • Kontis, Christopher; Mueller, Marcel R.; Kuechenmeister, Christian
  • Applied Optics, Vol. 51, Issue 3
  • DOI: 10.1364/AO.51.000385

Atomic-layer-deposited nanostructures for graphene-based nanoelectronics
journal, January 2008

  • Xuan, Y.; Wu, Y. Q.; Shen, T.
  • Applied Physics Letters, Vol. 92, Issue 1
  • DOI: 10.1063/1.2828338

Fine Structure Constant Defines Visual Transparency of Graphene
journal, June 2008

Optical properties of cubic hafnia stabilized with yttria
journal, January 1990

  • Wood, D. L.; Nassau, Kurt; Kometani, T. Y.
  • Applied Optics, Vol. 29, Issue 4, p. 604-607
  • DOI: 10.1364/AO.29.000604