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Title: Determination of the laser intensity applied to a Ta witness plate from the measured X-ray signal using a pulsed micro-channel plate detector

Abstract

The laser intensity distribution at the surface of a high-Z material, such as Ta, can be deduced from imaging the self-emission of the produced x-ray spot using suitable calibration data. This paper presents a calibration method which uses the measured x-ray emissions from laser spots of di erent intensities hitting a Ta witness plate. The x-ray emission is measured with a micro-channel plate (MCP) based x-ray framing camera plus filters. Data from di erent positions on one MCP strip or from di erent MCP assemblies are normalized to each other using a standard candle laser beam spot at 1x1014 W/cm2 intensity. The distribution of the resulting dataset agrees with results from a pseudo spectroscopic model for laser intensities between 4 and 15x1013 W/cm2. The model is then used to determine the absolute scaling factor between the experimental results from assemblies using two di erent x-ray filters. The data and model method also allows unique calibration factors for each MCP system and each MCP gain to be compared. We also present simulation results investigating alternate witness plate materials (Ag, Eu and Au).

Authors:
 [1];  [1];  [1];  [1];  [1];  [1];  [1]
  1. Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Publication Date:
Research Org.:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1368031
Report Number(s):
LLNL-JRNL-716802
Journal ID: ISSN 1574-1818
Grant/Contract Number:  
AC52-07NA27344
Resource Type:
Accepted Manuscript
Journal Name:
High Energy Density Physics
Additional Journal Information:
Journal Volume: 23; Journal ID: ISSN 1574-1818
Publisher:
Elsevier
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; 42 ENGINEERING; 70 PLASMA PHYSICS AND FUSION

Citation Formats

Pickworth, L. A., Rosen, M. D., Schneider, M. B., Hinkel, D. E., Benedetti, L. R., Kauffmann, R. L., and Wu, S. S. Determination of the laser intensity applied to a Ta witness plate from the measured X-ray signal using a pulsed micro-channel plate detector. United States: N. p., 2017. Web. https://doi.org/10.1016/j.hedp.2017.04.003.
Pickworth, L. A., Rosen, M. D., Schneider, M. B., Hinkel, D. E., Benedetti, L. R., Kauffmann, R. L., & Wu, S. S. Determination of the laser intensity applied to a Ta witness plate from the measured X-ray signal using a pulsed micro-channel plate detector. United States. https://doi.org/10.1016/j.hedp.2017.04.003
Pickworth, L. A., Rosen, M. D., Schneider, M. B., Hinkel, D. E., Benedetti, L. R., Kauffmann, R. L., and Wu, S. S. Fri . "Determination of the laser intensity applied to a Ta witness plate from the measured X-ray signal using a pulsed micro-channel plate detector". United States. https://doi.org/10.1016/j.hedp.2017.04.003. https://www.osti.gov/servlets/purl/1368031.
@article{osti_1368031,
title = {Determination of the laser intensity applied to a Ta witness plate from the measured X-ray signal using a pulsed micro-channel plate detector},
author = {Pickworth, L. A. and Rosen, M. D. and Schneider, M. B. and Hinkel, D. E. and Benedetti, L. R. and Kauffmann, R. L. and Wu, S. S.},
abstractNote = {The laser intensity distribution at the surface of a high-Z material, such as Ta, can be deduced from imaging the self-emission of the produced x-ray spot using suitable calibration data. This paper presents a calibration method which uses the measured x-ray emissions from laser spots of di erent intensities hitting a Ta witness plate. The x-ray emission is measured with a micro-channel plate (MCP) based x-ray framing camera plus filters. Data from di erent positions on one MCP strip or from di erent MCP assemblies are normalized to each other using a standard candle laser beam spot at 1x1014 W/cm2 intensity. The distribution of the resulting dataset agrees with results from a pseudo spectroscopic model for laser intensities between 4 and 15x1013 W/cm2. The model is then used to determine the absolute scaling factor between the experimental results from assemblies using two di erent x-ray filters. The data and model method also allows unique calibration factors for each MCP system and each MCP gain to be compared. We also present simulation results investigating alternate witness plate materials (Ag, Eu and Au).},
doi = {10.1016/j.hedp.2017.04.003},
journal = {High Energy Density Physics},
number = ,
volume = 23,
place = {United States},
year = {2017},
month = {4}
}

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