Single-view phase retrieval of an extended sample by exploiting edge detection and sparsity

Journal Article · 13 October 2016 · Optics Express

DOI: https://doi.org/10.1364/OE.24.024719 · OSTI ID:1366469

Tripathi, Ashish; McNulty, Ian; Munson, Todd; Wild, Stefan M.

We propose a new approach to robustly retrieve the exit wave of an extended sample from its coherent diffraction pattern by exploiting sparsity of the sample's edges. This approach enables imaging of an extended sample with a single view, without ptychography. We introduce nonlinear optimization methods that promote sparsity, and we derive update rules to robustly recover the sample's exit wave. We test these methods on simulated samples by varying the sparsity of the edge-detected representation of the exit wave. Finally, our tests illustrate the strengths and limitations of the proposed method in imaging extended samples.

• Research Organization: Argonne National Laboratory (ANL)
• Sponsoring Organization: USDOE Office of Science (SC), Advanced Scientific Computing Research (ASCR) (SC-21)
• Grant/Contract Number: AC02-06CH11357
• OSTI ID: 1366469
• Journal Information: Optics Express, Journal Name: Optics Express Journal Issue: 21 Vol. 24; ISSN 1094-4087; ISSN OPEXFF
• Publisher: Optical Society of America (OSA)Copyright Statement
• Country of Publication: United States
• Language: English