skip to main content

DOE PAGESDOE PAGES

Title: Single-view phase retrieval of an extended sample by exploiting edge detection and sparsity

We propose a new approach to robustly retrieve the exit wave of an extended sample from its coherent diffraction pattern by exploiting sparsity of the sample's edges. This approach enables imaging of an extended sample with a single view, without ptychography. We introduce nonlinear optimization methods that promote sparsity, and we derive update rules to robustly recover the sample's exit wave. We test these methods on simulated samples by varying the sparsity of the edge-detected representation of the exit wave. Finally, our tests illustrate the strengths and limitations of the proposed method in imaging extended samples.
Authors:
; ; ;
Publication Date:
Grant/Contract Number:
AC02-06CH11357
Type:
Accepted Manuscript
Journal Name:
Optics Express
Additional Journal Information:
Journal Volume: 24; Journal Issue: 21; Journal ID: ISSN 1094-4087
Publisher:
Optical Society of America (OSA)
Research Org:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org:
USDOE Office of Science (SC), Advanced Scientific Computing Research (ASCR) (SC-21)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; 97 MATHEMATICS AND COMPUTING; Diffraction; Image reconstruction techniques; Inverse problems; Noise in imaging systems; X-ray imaging
OSTI Identifier:
1366469

Tripathi, Ashish, McNulty, Ian, Munson, Todd, and Wild, Stefan M. Single-view phase retrieval of an extended sample by exploiting edge detection and sparsity. United States: N. p., Web. doi:10.1364/OE.24.024719.
Tripathi, Ashish, McNulty, Ian, Munson, Todd, & Wild, Stefan M. Single-view phase retrieval of an extended sample by exploiting edge detection and sparsity. United States. doi:10.1364/OE.24.024719.
Tripathi, Ashish, McNulty, Ian, Munson, Todd, and Wild, Stefan M. 2016. "Single-view phase retrieval of an extended sample by exploiting edge detection and sparsity". United States. doi:10.1364/OE.24.024719. https://www.osti.gov/servlets/purl/1366469.
@article{osti_1366469,
title = {Single-view phase retrieval of an extended sample by exploiting edge detection and sparsity},
author = {Tripathi, Ashish and McNulty, Ian and Munson, Todd and Wild, Stefan M.},
abstractNote = {We propose a new approach to robustly retrieve the exit wave of an extended sample from its coherent diffraction pattern by exploiting sparsity of the sample's edges. This approach enables imaging of an extended sample with a single view, without ptychography. We introduce nonlinear optimization methods that promote sparsity, and we derive update rules to robustly recover the sample's exit wave. We test these methods on simulated samples by varying the sparsity of the edge-detected representation of the exit wave. Finally, our tests illustrate the strengths and limitations of the proposed method in imaging extended samples.},
doi = {10.1364/OE.24.024719},
journal = {Optics Express},
number = 21,
volume = 24,
place = {United States},
year = {2016},
month = {10}
}