Polymeric spatial resolution test patterns for mass spectrometry imaging using nano-thermal analysis with atomic force microscopy
Abstract
As the spatial resolution of mass spectrometry imaging technologies has begun to reach into the nanometer regime, finding readily available or easily made resolution reference materials has become particularly challenging for molecular imaging purposes. This study describes the fabrication, characterization and use of vertical line array polymeric spatial resolution test patterns for nano-thermal analysis/atomic force microscopy/mass spectrometry chemical imaging.
- Authors:
-
[2]
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States); Lab. for Physical Sciences, College Park, MD (United States)
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
- Publication Date:
- Research Org.:
- Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
- Sponsoring Org.:
- USDOE Office of Science (SC)
- OSTI Identifier:
- 1366411
- Grant/Contract Number:
- AC05-00OR22725
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Rapid Communications in Mass Spectrometry
- Additional Journal Information:
- Journal Volume: 31; Journal Issue: 14; Journal ID: ISSN 0951-4198
- Publisher:
- Wiley
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY; resolution test pattern; nano-TA; atomic force microscopy; mass spectrometry imaging; submicrometer spatial resolution; thermolysis; atmospheric pressure
Citation Formats
Tai, Tamin, Kertesz, Vilmos, Lin, Ming -Wei, Srijanto, Bernadeta R., Hensley, Dale K., Xiao, Kai, and Van Berkel, Gary J. Polymeric spatial resolution test patterns for mass spectrometry imaging using nano-thermal analysis with atomic force microscopy. United States: N. p., 2017.
Web. doi:10.1002/rcm.7894.
Tai, Tamin, Kertesz, Vilmos, Lin, Ming -Wei, Srijanto, Bernadeta R., Hensley, Dale K., Xiao, Kai, & Van Berkel, Gary J. Polymeric spatial resolution test patterns for mass spectrometry imaging using nano-thermal analysis with atomic force microscopy. United States. https://doi.org/10.1002/rcm.7894
Tai, Tamin, Kertesz, Vilmos, Lin, Ming -Wei, Srijanto, Bernadeta R., Hensley, Dale K., Xiao, Kai, and Van Berkel, Gary J. Thu .
"Polymeric spatial resolution test patterns for mass spectrometry imaging using nano-thermal analysis with atomic force microscopy". United States. https://doi.org/10.1002/rcm.7894. https://www.osti.gov/servlets/purl/1366411.
@article{osti_1366411,
title = {Polymeric spatial resolution test patterns for mass spectrometry imaging using nano-thermal analysis with atomic force microscopy},
author = {Tai, Tamin and Kertesz, Vilmos and Lin, Ming -Wei and Srijanto, Bernadeta R. and Hensley, Dale K. and Xiao, Kai and Van Berkel, Gary J.},
abstractNote = {As the spatial resolution of mass spectrometry imaging technologies has begun to reach into the nanometer regime, finding readily available or easily made resolution reference materials has become particularly challenging for molecular imaging purposes. This study describes the fabrication, characterization and use of vertical line array polymeric spatial resolution test patterns for nano-thermal analysis/atomic force microscopy/mass spectrometry chemical imaging.},
doi = {10.1002/rcm.7894},
journal = {Rapid Communications in Mass Spectrometry},
number = 14,
volume = 31,
place = {United States},
year = {Thu May 11 00:00:00 EDT 2017},
month = {Thu May 11 00:00:00 EDT 2017}
}
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