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Title: Development of a modular test system for the silicon sensor R&D of the ATLAS Upgrade

High Voltage CMOS sensors are a promising technology for tracking detectors in collider experiments. Extensive R&D studies are being carried out by the ATLAS Collaboration for a possible use of HV-CMOS in the High Luminosity LHC upgrade of the Inner Tracker detector. CaRIBOu (Control and Readout Itk BOard) is a modular test system developed to test Silicon based detectors. It currently includes five custom designed boards, a Xilinx ZC706 development board, FELIX (Front-End LInk eXchange) PCIe card and a host computer. A software program has been developed in Python to control the CaRIBOu hardware. CaRIBOu has been used in the testbeam of the HV-CMOS sensor AMS180v4 at CERN. Preliminary results have shown that the test system is very versatile. In conclusion, further development is ongoing to adapt to different sensors, and to make it available to various lab test stands.
Authors:
 [1] ;  [2] ;  [3] ;  [3] ;  [2] ;  [2] ;  [3] ;  [4] ;  [5] ;  [2] ;  [3] ;  [3] ;  [6]
  1. Univ. of Science and Technology of China, Hefei (China). State Key Lab. of Particle Detection and Electronics; Brookhaven National Lab. (BNL), Upton, NY (United States). Dept. of Physics
  2. Univ. of Geneva (Switzerland). Dept. of Nuclear and Particle Physics
  3. Brookhaven National Lab. (BNL), Upton, NY (United States). Dept. of Physics
  4. Karlsruhe Inst. of Technology (KIT) (Germany)
  5. Univ. of Geneva (Switzerland). Dept. of Nuclear and Particle Physics; European Organization for Nuclear Research (CERN), Geneva (Switzerland)
  6. Univ. of Science and Technology of China, Hefei (China). State Key Lab. of Particle Detection and Electronics
Publication Date:
Report Number(s):
BNL-113872-2017-JA
Journal ID: ISSN 1748-0221; R&D Project: PO 024; KA2501032
Grant/Contract Number:
SC0012704
Type:
Accepted Manuscript
Journal Name:
Journal of Instrumentation
Additional Journal Information:
Journal Volume: 12; Journal Issue: 01; Journal ID: ISSN 1748-0221
Publisher:
Institute of Physics (IOP)
Research Org:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Org:
USDOE Office of Science (SC), High Energy Physics (HEP) (SC-25)
Country of Publication:
United States
Language:
English
Subject:
72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS; 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; 43 PARTICLE ACCELERATORS; HV-CMOS pixel detector; Beam Test; ATLAS ITk Upgrade
OSTI Identifier:
1361249

Liu, H., Benoit, M., Chen, H., Chen, K., Bello, F. A. Di, Iacobucci, G., Lanni, F., Peric, I., Ristic, B., Pinto, M. Vicente Barreto, Wu, W., Xu, L., and Jin, G.. Development of a modular test system for the silicon sensor R&D of the ATLAS Upgrade. United States: N. p., Web. doi:10.1088/1748-0221/12/01/P01008.
Liu, H., Benoit, M., Chen, H., Chen, K., Bello, F. A. Di, Iacobucci, G., Lanni, F., Peric, I., Ristic, B., Pinto, M. Vicente Barreto, Wu, W., Xu, L., & Jin, G.. Development of a modular test system for the silicon sensor R&D of the ATLAS Upgrade. United States. doi:10.1088/1748-0221/12/01/P01008.
Liu, H., Benoit, M., Chen, H., Chen, K., Bello, F. A. Di, Iacobucci, G., Lanni, F., Peric, I., Ristic, B., Pinto, M. Vicente Barreto, Wu, W., Xu, L., and Jin, G.. 2017. "Development of a modular test system for the silicon sensor R&D of the ATLAS Upgrade". United States. doi:10.1088/1748-0221/12/01/P01008. https://www.osti.gov/servlets/purl/1361249.
@article{osti_1361249,
title = {Development of a modular test system for the silicon sensor R&D of the ATLAS Upgrade},
author = {Liu, H. and Benoit, M. and Chen, H. and Chen, K. and Bello, F. A. Di and Iacobucci, G. and Lanni, F. and Peric, I. and Ristic, B. and Pinto, M. Vicente Barreto and Wu, W. and Xu, L. and Jin, G.},
abstractNote = {High Voltage CMOS sensors are a promising technology for tracking detectors in collider experiments. Extensive R&D studies are being carried out by the ATLAS Collaboration for a possible use of HV-CMOS in the High Luminosity LHC upgrade of the Inner Tracker detector. CaRIBOu (Control and Readout Itk BOard) is a modular test system developed to test Silicon based detectors. It currently includes five custom designed boards, a Xilinx ZC706 development board, FELIX (Front-End LInk eXchange) PCIe card and a host computer. A software program has been developed in Python to control the CaRIBOu hardware. CaRIBOu has been used in the testbeam of the HV-CMOS sensor AMS180v4 at CERN. Preliminary results have shown that the test system is very versatile. In conclusion, further development is ongoing to adapt to different sensors, and to make it available to various lab test stands.},
doi = {10.1088/1748-0221/12/01/P01008},
journal = {Journal of Instrumentation},
number = 01,
volume = 12,
place = {United States},
year = {2017},
month = {1}
}