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Title: Solid state dielectric screening versus band gap trends and implications

Authors:
; ;
Publication Date:
Type:
Publisher's Accepted Manuscript
Journal Name:
Optical Materials
Additional Journal Information:
Journal Volume: 60; Journal Issue: C; Related Information: CHORUS Timestamp: 2018-09-10 01:21:18; Journal ID: ISSN 0925-3467
Publisher:
Elsevier
Sponsoring Org:
USDOE
Country of Publication:
Netherlands
Language:
English
OSTI Identifier:
1359718

Ravichandran, Ram, Wang, Alan X., and Wager, John F.. Solid state dielectric screening versus band gap trends and implications. Netherlands: N. p., Web. doi:10.1016/j.optmat.2016.07.027.
Ravichandran, Ram, Wang, Alan X., & Wager, John F.. Solid state dielectric screening versus band gap trends and implications. Netherlands. doi:10.1016/j.optmat.2016.07.027.
Ravichandran, Ram, Wang, Alan X., and Wager, John F.. 2016. "Solid state dielectric screening versus band gap trends and implications". Netherlands. doi:10.1016/j.optmat.2016.07.027.
@article{osti_1359718,
title = {Solid state dielectric screening versus band gap trends and implications},
author = {Ravichandran, Ram and Wang, Alan X. and Wager, John F.},
abstractNote = {},
doi = {10.1016/j.optmat.2016.07.027},
journal = {Optical Materials},
number = C,
volume = 60,
place = {Netherlands},
year = {2016},
month = {10}
}