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Title: High temperature digital image correlation evaluation of in-situ failure mechanism: An experimental framework with application to C/SiC composites

Authors:
; ; ; ; ; ;
Publication Date:
Type:
Publisher's Accepted Manuscript
Journal Name:
Materials Science and Engineering. A, Structural Materials: Properties, Microstructure and Processing
Additional Journal Information:
Journal Volume: 665; Journal Issue: C; Related Information: CHORUS Timestamp: 2018-09-13 08:56:44; Journal ID: ISSN 0921-5093
Publisher:
Elsevier
Sponsoring Org:
USDOE
Country of Publication:
Netherlands
Language:
English
OSTI Identifier:
1359586

Mao, W. G., Chen, J., Si, M. S., Zhang, R. F., Ma, Q. S., Fang, D. N., and Chen, X.. High temperature digital image correlation evaluation of in-situ failure mechanism: An experimental framework with application to C/SiC composites. Netherlands: N. p., Web. doi:10.1016/j.msea.2016.04.021.
Mao, W. G., Chen, J., Si, M. S., Zhang, R. F., Ma, Q. S., Fang, D. N., & Chen, X.. High temperature digital image correlation evaluation of in-situ failure mechanism: An experimental framework with application to C/SiC composites. Netherlands. doi:10.1016/j.msea.2016.04.021.
Mao, W. G., Chen, J., Si, M. S., Zhang, R. F., Ma, Q. S., Fang, D. N., and Chen, X.. 2016. "High temperature digital image correlation evaluation of in-situ failure mechanism: An experimental framework with application to C/SiC composites". Netherlands. doi:10.1016/j.msea.2016.04.021.
@article{osti_1359586,
title = {High temperature digital image correlation evaluation of in-situ failure mechanism: An experimental framework with application to C/SiC composites},
author = {Mao, W. G. and Chen, J. and Si, M. S. and Zhang, R. F. and Ma, Q. S. and Fang, D. N. and Chen, X.},
abstractNote = {},
doi = {10.1016/j.msea.2016.04.021},
journal = {Materials Science and Engineering. A, Structural Materials: Properties, Microstructure and Processing},
number = C,
volume = 665,
place = {Netherlands},
year = {2016},
month = {5}
}