skip to main content
DOE PAGES title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: 3-D point defect density distributions in thin film Cu(In,Ga)Se2 measured by atom probe tomography

Authors:
; ; ; ;
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1358702
Grant/Contract Number:  
AC36-08-GO28308
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Acta Materialia
Additional Journal Information:
Journal Name: Acta Materialia Journal Volume: 102 Journal Issue: C; Journal ID: ISSN 1359-6454
Publisher:
Elsevier
Country of Publication:
United States
Language:
English

Citation Formats

Stokes, Adam, Al-Jassim, Mowafak, Diercks, David R., Egaas, Brian, and Gorman, Brian. 3-D point defect density distributions in thin film Cu(In,Ga)Se2 measured by atom probe tomography. United States: N. p., 2016. Web. doi:10.1016/j.actamat.2015.09.035.
Stokes, Adam, Al-Jassim, Mowafak, Diercks, David R., Egaas, Brian, & Gorman, Brian. 3-D point defect density distributions in thin film Cu(In,Ga)Se2 measured by atom probe tomography. United States. doi:10.1016/j.actamat.2015.09.035.
Stokes, Adam, Al-Jassim, Mowafak, Diercks, David R., Egaas, Brian, and Gorman, Brian. Fri . "3-D point defect density distributions in thin film Cu(In,Ga)Se2 measured by atom probe tomography". United States. doi:10.1016/j.actamat.2015.09.035.
@article{osti_1358702,
title = {3-D point defect density distributions in thin film Cu(In,Ga)Se2 measured by atom probe tomography},
author = {Stokes, Adam and Al-Jassim, Mowafak and Diercks, David R. and Egaas, Brian and Gorman, Brian},
abstractNote = {},
doi = {10.1016/j.actamat.2015.09.035},
journal = {Acta Materialia},
number = C,
volume = 102,
place = {United States},
year = {2016},
month = {1}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1016/j.actamat.2015.09.035

Citation Metrics:
Cited by: 3 works
Citation information provided by
Web of Science

Save / Share: