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Title: 3-D point defect density distributions in thin film Cu(In,Ga)Se 2 measured by atom probe tomography

Authors:
; ; ; ;
Publication Date:
Grant/Contract Number:
AC36-08-GO28308
Type:
Publisher's Accepted Manuscript
Journal Name:
Acta Materialia
Additional Journal Information:
Journal Volume: 102; Journal Issue: C; Related Information: CHORUS Timestamp: 2018-09-19 00:22:27; Journal ID: ISSN 1359-6454
Publisher:
Elsevier
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
OSTI Identifier:
1358702

Stokes, Adam, Al-Jassim, Mowafak, Diercks, David R., Egaas, Brian, and Gorman, Brian. 3-D point defect density distributions in thin film Cu(In,Ga)Se 2 measured by atom probe tomography. United States: N. p., Web. doi:10.1016/j.actamat.2015.09.035.
Stokes, Adam, Al-Jassim, Mowafak, Diercks, David R., Egaas, Brian, & Gorman, Brian. 3-D point defect density distributions in thin film Cu(In,Ga)Se 2 measured by atom probe tomography. United States. doi:10.1016/j.actamat.2015.09.035.
Stokes, Adam, Al-Jassim, Mowafak, Diercks, David R., Egaas, Brian, and Gorman, Brian. 2016. "3-D point defect density distributions in thin film Cu(In,Ga)Se 2 measured by atom probe tomography". United States. doi:10.1016/j.actamat.2015.09.035.
@article{osti_1358702,
title = {3-D point defect density distributions in thin film Cu(In,Ga)Se 2 measured by atom probe tomography},
author = {Stokes, Adam and Al-Jassim, Mowafak and Diercks, David R. and Egaas, Brian and Gorman, Brian},
abstractNote = {},
doi = {10.1016/j.actamat.2015.09.035},
journal = {Acta Materialia},
number = C,
volume = 102,
place = {United States},
year = {2016},
month = {1}
}