3-D point defect density distributions in thin film Cu(In,Ga)Se2 measured by atom probe tomography
- Authors:
- Publication Date:
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1358702
- Resource Type:
- Publisher's Accepted Manuscript
- Journal Name:
- Acta Materialia
- Additional Journal Information:
- Journal Name: Acta Materialia Journal Volume: 102 Journal Issue: C; Journal ID: ISSN 1359-6454
- Publisher:
- Elsevier
- Country of Publication:
- United States
- Language:
- English
Citation Formats
Stokes, Adam, Al-Jassim, Mowafak, Diercks, David R., Egaas, Brian, and Gorman, Brian. 3-D point defect density distributions in thin film Cu(In,Ga)Se2 measured by atom probe tomography. United States: N. p., 2016.
Web. doi:10.1016/j.actamat.2015.09.035.
Stokes, Adam, Al-Jassim, Mowafak, Diercks, David R., Egaas, Brian, & Gorman, Brian. 3-D point defect density distributions in thin film Cu(In,Ga)Se2 measured by atom probe tomography. United States. https://doi.org/10.1016/j.actamat.2015.09.035
Stokes, Adam, Al-Jassim, Mowafak, Diercks, David R., Egaas, Brian, and Gorman, Brian. Fri .
"3-D point defect density distributions in thin film Cu(In,Ga)Se2 measured by atom probe tomography". United States. https://doi.org/10.1016/j.actamat.2015.09.035.
@article{osti_1358702,
title = {3-D point defect density distributions in thin film Cu(In,Ga)Se2 measured by atom probe tomography},
author = {Stokes, Adam and Al-Jassim, Mowafak and Diercks, David R. and Egaas, Brian and Gorman, Brian},
abstractNote = {},
doi = {10.1016/j.actamat.2015.09.035},
journal = {Acta Materialia},
number = C,
volume = 102,
place = {United States},
year = {Fri Jan 01 00:00:00 EST 2016},
month = {Fri Jan 01 00:00:00 EST 2016}
}
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https://doi.org/10.1016/j.actamat.2015.09.035
https://doi.org/10.1016/j.actamat.2015.09.035
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