skip to main content

DOE PAGESDOE PAGES

Title: A 3D contact analysis approach for the visualization of the electrical contact asperities

The electrical contact is an important phenomenon that should be given into consideration to achieve better performance and long term reliability for the design of devices. Based upon this importance, the electrical contact interface has been visualized as a “3D Contact Map” and used in order to investigate the contact asperities. The contact asperities describe the structures above and below the contact spots (the contact spots define the 3D contact map) to the two conductors which make the contact system. The contact asperities require the discretization of the 3D microstructures of the contact system into voxels. A contact analysis approach has been developed and introduced in this paper which shows the way to the 3D visualization of the contact asperities of a given contact system. For the discretization of 3D microstructure of contact system into voxels, X-ray Computed Tomography (CT) method is used in order to collect the data of a 250 V, 16 A rated AC single pole rocker switch which is used as a contact system for investigation.
Authors:
ORCiD logo [1] ;  [1]
  1. Heriot-Watt Univ., Edinburgh (United Kingdom). School of Engineering and Physical Sciences
Publication Date:
Grant/Contract Number:
FC02-06ER25781; P41 GM103545-17
Type:
Accepted Manuscript
Journal Name:
AIP Advances
Additional Journal Information:
Journal Volume: 7; Journal Issue: 1; Journal ID: ISSN 2158-3226
Publisher:
American Institute of Physics (AIP)
Research Org:
Univ. of Utah, Salt Lake City, UT (United States)
Sponsoring Org:
USDOE; National Institutes of Health (NIH); Engineering and Physical Sciences Research Council (EPSRC)
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; Conductors; Computed tomography; Three dimensional image processing; X-ray imaging; Image reconstruction
OSTI Identifier:
1358367