Efficient modeling of Bragg coherent x-ray nanobeam diffraction

Hruszkewycz, S. O.; Holt, M. V.; Allain, M.; Chamard, V.; Polvino, S. M.; Murray, C. E.; Fuoss, P. H.

doi:10.1364/OL.40.003241

Title: Efficient modeling of Bragg coherent x-ray nanobeam diffraction

Abstract

X-ray Bragg diffraction experiments that utilize tightly focused coherent beams produce complicated Bragg diffraction patterns that depend on scattering geometry, characteristics of the sample, and properties of the x-ray focusing optic. In this paper, we use a Fourier-transform-based method of modeling the 2D intensity distribution of a Bragg peak and apply it to the case of thin films illuminated with a Fresnel zone plate in three different Bragg scattering geometries. Finally, the calculations agree well with experimental coherent diffraction patterns, demonstrating that nanodiffraction patterns can be modeled at nonsymmetric Bragg conditions with this approach—a capability critical for advancing nanofocused x-ray diffraction microscopy.

Authors:

Hruszkewycz, S. O. ^[1]; Holt, M. V. ^[2]; Allain, M. ^[3]; Chamard, V. ^[3]; Polvino, S. M. ^[4]; Murray, C. E. ^[5]; Fuoss, P. H. ^[1]

Argonne National Lab. (ANL), Argonne, IL (United States). Materials Science Division
Argonne National Lab. (ANL), Argonne, IL (United States). Center for Nanoscale Materials
Aix-Marseille Univ., Marseille (France). CNRS. Fresnel Inst.
Columbia Univ., New York, NY (United States). Dept. of Applied Physics and Mathematics
Thomas J. Watson Research Center, Yorktown Heights, NY (United States). IBM Corporation

Publication Date:: Thu Jul 02 00:00:00 EDT 2015

Research Org.:: Argonne National Lab. (ANL), Argonne, IL (United States); Aix-Marseille Univ., Marseille (France)

Sponsoring Org.:: USDOE Office of Science (SC), Basic Energy Sciences (BES); National Agency for Research (ANR) (France)

Contributing Org.:: Columbia Univ., New York, NY (United States); Thomas J. Watson Research Center, Yorktown Heights, NY (United States)

OSTI Identifier:: 1356646

Alternate Identifier(s):: OSTI ID: 1222258

Grant/Contract Number:: AC02-06CH11357; ANR-11-BS10-0005

Resource Type:: Accepted Manuscript

Journal Name:: Optics Letters

Additional Journal Information:: Journal Volume: 40; Journal Issue: 14; Journal ID: ISSN 0146-9592

Publisher:: Optical Society of America (OSA)

Country of Publication:: United States

Language:: English

Subject:: 36 MATERIALS SCIENCE; Diffractive optics; Far field diffraction; High numerical aperture optics; Ptychography; Scanning probe microscopy; X ray optics; Coherence; Synchrotron radiation

Citation Formats


                    Hruszkewycz, S. O., Holt, M. V., Allain, M., Chamard, V., Polvino, S. M., Murray, C. E., and Fuoss, P. H. Efficient modeling of Bragg coherent x-ray nanobeam diffraction.  United States: N. p., 2015. 
Web.  doi:10.1364/OL.40.003241.

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                    Hruszkewycz, S. O., Holt, M. V., Allain, M., Chamard, V., Polvino, S. M., Murray, C. E., & Fuoss, P. H. Efficient modeling of Bragg coherent x-ray nanobeam diffraction.  United States.  https://doi.org/10.1364/OL.40.003241

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                    Hruszkewycz, S. O., Holt, M. V., Allain, M., Chamard, V., Polvino, S. M., Murray, C. E., and Fuoss, P. H. Thu .  
"Efficient modeling of Bragg coherent x-ray nanobeam diffraction".  United States.  https://doi.org/10.1364/OL.40.003241.  https://www.osti.gov/servlets/purl/1356646.

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@article{osti_1356646,

  title        = {Efficient modeling of Bragg coherent x-ray nanobeam diffraction},

  author       = {Hruszkewycz, S. O. and Holt, M. V. and Allain, M. and Chamard, V. and Polvino, S. M. and Murray, C. E. and Fuoss, P. H.},

  abstractNote = {X-ray Bragg diffraction experiments that utilize tightly focused coherent beams produce complicated Bragg diffraction patterns that depend on scattering geometry, characteristics of the sample, and properties of the x-ray focusing optic. In this paper, we use a Fourier-transform-based method of modeling the 2D intensity distribution of a Bragg peak and apply it to the case of thin films illuminated with a Fresnel zone plate in three different Bragg scattering geometries. Finally, the calculations agree well with experimental coherent diffraction patterns, demonstrating that nanodiffraction patterns can be modeled at nonsymmetric Bragg conditions with this approach—a capability critical for advancing nanofocused x-ray diffraction microscopy.},

  doi          = {10.1364/OL.40.003241},

  journal      = {Optics Letters},

  number       = 14,

  volume       = 40,

  place        = {United States},

  year         = {Thu Jul 02 00:00:00 EDT 2015},

  month        = {Thu Jul 02 00:00:00 EDT 2015}

}

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Works referenced in this record:

Nanoscale Hard X-Ray Microscopy Methods for Materials Studies
journal, July 2013

Holt, Martin; Harder, Ross; Winarski, Robert
Annual Review of Materials Research, Vol. 43, Issue 1
DOI: 10.1146/annurev-matsci-071312-121654

Modeling of kinematic diffraction from a thin silicon film illuminated by a coherent, focused X-ray nanobeam
journal, April 2010

Ying, Andrew; Osting, Braxton; Noyan, I. C.
Journal of Applied Crystallography, Vol. 43, Issue 3
DOI: 10.1107/S0021889810008459

Quantitative Nanoscale Imaging of Lattice Distortions in Epitaxial Semiconductor Heterostructures Using Nanofocused X-ray Bragg Projection Ptychography
journal, September 2012

Hruszkewycz, S. O.; Holt, M. V.; Murray, C. E.
Nano Letters, Vol. 12, Issue 10
DOI: 10.1021/nl303201w

Coherent X-ray diffraction imaging of strain at the nanoscale
journal, April 2009

Robinson, Ian; Harder, Ross
Nature Materials, Vol. 8, Issue 4
DOI: 10.1038/nmat2400

Framework for three-dimensional coherent diffraction imaging by focused beam x-ray Bragg ptychography
journal, January 2011

Hruszkewycz, Stephan O.; Holt, Martin V.; Tripathi, Ash
Optics Letters, Vol. 36, Issue 12
DOI: 10.1364/OL.36.002227

Strain measured in a silicon-on-insulator, complementary metal-oxide-semiconductor device channel induced by embedded silicon-carbon source/drain regions
journal, February 2009

Murray, Conal E.; Ren, Z.; Ying, A.
Applied Physics Letters, Vol. 94, Issue 6
DOI: 10.1063/1.3079656

Coherent Bragg nanodiffraction at the hard X-ray Nanoprobe beamline
journal, March 2014

Hruszkewycz, S. O.; Holt, M. V.; Maser, J.
Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences, Vol. 372, Issue 2010
DOI: 10.1098/rsta.2013.0118

Nanomembrane-based materials for Group IV semiconductor quantum electronics
journal, February 2014

Paskiewicz, D. M.; Savage, D. E.; Holt, M. V.
Scientific Reports, Vol. 4, Issue 1
DOI: 10.1038/srep04218

Works referencing / citing this record:

High-resolution three-dimensional structural microscopy by single-angle Bragg ptychography
journal, November 2016

Hruszkewycz, S. O.; Allain, M.; Holt, M. V.
Nature Materials, Vol. 16, Issue 2
DOI: 10.1038/nmat4798

Imaging nanoscale lattice variations by machine learning of x-ray diffraction microscopy data
journal, August 2016

Laanait, Nouamane; Zhang, Zhan; Schlepütz, Christian M.
Nanotechnology, Vol. 27, Issue 37
DOI: 10.1088/0957-4484/27/37/374002

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Similar Records

Title: Efficient modeling of Bragg coherent x-ray nanobeam diffraction

Abstract

Citation Formats

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Modeling of kinematic diffraction from a thin silicon film illuminated by a coherent, focused X-ray nanobeam journal, April 2010

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