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Title: X-ray spectrometer based on a bent diamond crystal for high repetition rate free-electron laser applications

Abstract

A precise spectral characterization of every single pulse is required in many x-ray free-electron laser (XFEL) experiments due to the fluctuating spectral content of self-amplified spontaneous emission (SASE) beams. Bent single-crystal spectrometers can provide sufficient spectral resolution to resolve the SASE spikes while also covering the full SASE bandwidth. To better withstand the high heat load induced by the 4.5 MHz repetition rate of pulses at the forthcoming European XFEL facility, a spectrometer based on single-crystal diamond has been developed. Here, we report a direct comparison of the diamond spectrometer with its Si counterpart in experiments performed at the Linac Coherent Light Source.

Authors:
 [1];  [1];  [1];  [2];  [3];  [1];  [2];  [2];  [2];  [3];  [1];  [2];  [1]
  1. European X-Ray Free- Electron Laser Facility, Schenefeld (Germany)
  2. SLAC National Accelerator Lab., Menlo Park, CA (United States)
  3. Technological Institute for Superhard and Novel Carbon Materials, Moscow (Russia)
Publication Date:
Research Org.:
SLAC National Accelerator Lab., Menlo Park, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1353169
Grant/Contract Number:  
AC02-76SF00515
Resource Type:
Accepted Manuscript
Journal Name:
Optics Express
Additional Journal Information:
Journal Volume: 25; Journal Issue: 3; Journal ID: ISSN 1094-4087
Publisher:
Optical Society of America (OSA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; 43 PARTICLE ACCELERATORS; Scattering measurements; Spectroscopy; X-ray

Citation Formats

Boesenberg, Ulrike, Samoylova, Liubov, Roth, Thomas, Zhu, Diling, Terentyev, Sergey, Vannoni, Maurizio, Feng, Yiping, van Driel, Tim Brandt, Song, Sanghoon, Blank, Vladimir, Sinn, Harald, Robert, Aymeric, and Madsen, Anders. X-ray spectrometer based on a bent diamond crystal for high repetition rate free-electron laser applications. United States: N. p., 2017. Web. doi:10.1364/OE.25.002852.
Boesenberg, Ulrike, Samoylova, Liubov, Roth, Thomas, Zhu, Diling, Terentyev, Sergey, Vannoni, Maurizio, Feng, Yiping, van Driel, Tim Brandt, Song, Sanghoon, Blank, Vladimir, Sinn, Harald, Robert, Aymeric, & Madsen, Anders. X-ray spectrometer based on a bent diamond crystal for high repetition rate free-electron laser applications. United States. https://doi.org/10.1364/OE.25.002852
Boesenberg, Ulrike, Samoylova, Liubov, Roth, Thomas, Zhu, Diling, Terentyev, Sergey, Vannoni, Maurizio, Feng, Yiping, van Driel, Tim Brandt, Song, Sanghoon, Blank, Vladimir, Sinn, Harald, Robert, Aymeric, and Madsen, Anders. Fri . "X-ray spectrometer based on a bent diamond crystal for high repetition rate free-electron laser applications". United States. https://doi.org/10.1364/OE.25.002852. https://www.osti.gov/servlets/purl/1353169.
@article{osti_1353169,
title = {X-ray spectrometer based on a bent diamond crystal for high repetition rate free-electron laser applications},
author = {Boesenberg, Ulrike and Samoylova, Liubov and Roth, Thomas and Zhu, Diling and Terentyev, Sergey and Vannoni, Maurizio and Feng, Yiping and van Driel, Tim Brandt and Song, Sanghoon and Blank, Vladimir and Sinn, Harald and Robert, Aymeric and Madsen, Anders},
abstractNote = {A precise spectral characterization of every single pulse is required in many x-ray free-electron laser (XFEL) experiments due to the fluctuating spectral content of self-amplified spontaneous emission (SASE) beams. Bent single-crystal spectrometers can provide sufficient spectral resolution to resolve the SASE spikes while also covering the full SASE bandwidth. To better withstand the high heat load induced by the 4.5 MHz repetition rate of pulses at the forthcoming European XFEL facility, a spectrometer based on single-crystal diamond has been developed. Here, we report a direct comparison of the diamond spectrometer with its Si counterpart in experiments performed at the Linac Coherent Light Source.},
doi = {10.1364/OE.25.002852},
journal = {Optics Express},
number = 3,
volume = 25,
place = {United States},
year = {Fri Feb 03 00:00:00 EST 2017},
month = {Fri Feb 03 00:00:00 EST 2017}
}

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Works referencing / citing this record:

Diffraction properties of a strongly bent diamond crystal used as a dispersive spectrometer for XFEL pulses
journal, June 2019

  • Samoylova, Liubov; Boesenberg, Ulrike; Chumakov, Aleksandr
  • Journal of Synchrotron Radiation, Vol. 26, Issue 4
  • DOI: 10.1107/s1600577519004880

Scientific instrument Femtosecond X-ray Experiments (FXE): instrumentation and baseline experimental capabilities
journal, August 2019

  • Galler, Andreas; Gawelda, Wojciech; Biednov, Mykola
  • Journal of Synchrotron Radiation, Vol. 26, Issue 5
  • DOI: 10.1107/s1600577519006647

Photon Beam Transport and Scientific Instruments at the European XFEL
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