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Title: Perfect X-ray focusing via fitting corrective glasses to aberrated optics

Due to their short wavelength, X-rays can in principle be focused down to a few nanometres and below. At the same time, it is this short wavelength that puts stringent requirements on X-ray optics and their metrology. Both are limited by today’s technology. In this work, we present accurate at wavelength measurements of residual aberrations of a refractive X-ray lens using ptychography to manufacture a corrective phase plate. Together with the fitted phase plate the optics shows diffraction-limited performance, generating a nearly Gaussian beam profile with a Strehl ratio above 0.8. As a result, this scheme can be applied to any other focusing optics, thus solving the X-ray optical problem at synchrotron radiation sources and X-ray free-electron lasers.
Authors:
 [1] ;  [2] ;  [2] ;  [3] ;  [4] ;  [5] ;  [5] ;  [5] ;  [6] ; ORCiD logo [6] ;  [6] ;  [6] ;  [7] ;  [7] ;  [2] ;  [2] ;  [2] ;  [8] ;  [8] ;  [8] more »;  [9] « less
  1. Technische Univ. Dresden, Dresden (Germany); Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany); SLAC National Accelerator Lab., Menlo Park, CA (United States)
  2. Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)
  3. Technische Univ. Dresden, Dresden (Germany); Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)
  4. Friedrich-Schiller-Univ. Jena, Jena (Germany); SLAC National Accelerator Lab., Menlo Park, CA (United States)
  5. Friedrich-Schiller-Univ. Jena, Jena (Germany)
  6. Albanova Univ. Center, Stockholm (Sweden)
  7. Diamond Light Source Ltd., Oxfordshire (United Kingdom)
  8. SLAC National Accelerator Lab., Menlo Park, CA (United States)
  9. Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany); Univ. Hamburg, Hamburg (Germany)
Publication Date:
Grant/Contract Number:
AC02-76SF00515
Type:
Accepted Manuscript
Journal Name:
Nature Communications
Additional Journal Information:
Journal Volume: 8; Journal ID: ISSN 2041-1723
Publisher:
Nature Publishing Group
Research Org:
SLAC National Accelerator Lab., Menlo Park, CA (United States)
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; imaging and sensing; microscopy; X-rays
OSTI Identifier:
1352167