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Title: Influence of Vapor Deposition on Structural and Charge Transport Properties of Ethylbenzene Films

Authors:
ORCiD logo [1]; ORCiD logo [2];  [1];  [3]; ORCiD logo [4]; ORCiD logo [2]
  1. Institute for Molecular Engineering, University of Chicago, Chicago, Illinois 60637, United States
  2. Institute for Molecular Engineering, University of Chicago, Chicago, Illinois 60637, United States, The Institute for Molecular Engineering, Argonne National Laboratory, Lemont, Illinois 06349, United States
  3. Advanced Leadership Computing Facility, Argonne National Laboratory, Lemont, Illinois 06349, United States
  4. Department of Chemistry, University of Wisconsin—Madison, Madison, Wisconsin 53706, United States
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
National Science Foundation (NSF); USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1351665
Alternate Identifier(s):
OSTI ID: 1369460; OSTI ID: 1393175
Grant/Contract Number:  
AC02-06CH11357
Resource Type:
Published Article
Journal Name:
ACS Central Science
Additional Journal Information:
Journal Name: ACS Central Science Journal Volume: 3 Journal Issue: 5; Journal ID: ISSN 2374-7943
Publisher:
American Chemical Society
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY

Citation Formats

Antony, Lucas W., Jackson, Nicholas E., Lyubimov, Ivan, Vishwanath, Venkatram, Ediger, Mark D., and de Pablo, Juan J. Influence of Vapor Deposition on Structural and Charge Transport Properties of Ethylbenzene Films. United States: N. p., 2017. Web. doi:10.1021/acscentsci.7b00041.
Antony, Lucas W., Jackson, Nicholas E., Lyubimov, Ivan, Vishwanath, Venkatram, Ediger, Mark D., & de Pablo, Juan J. Influence of Vapor Deposition on Structural and Charge Transport Properties of Ethylbenzene Films. United States. doi:10.1021/acscentsci.7b00041.
Antony, Lucas W., Jackson, Nicholas E., Lyubimov, Ivan, Vishwanath, Venkatram, Ediger, Mark D., and de Pablo, Juan J. Fri . "Influence of Vapor Deposition on Structural and Charge Transport Properties of Ethylbenzene Films". United States. doi:10.1021/acscentsci.7b00041.
@article{osti_1351665,
title = {Influence of Vapor Deposition on Structural and Charge Transport Properties of Ethylbenzene Films},
author = {Antony, Lucas W. and Jackson, Nicholas E. and Lyubimov, Ivan and Vishwanath, Venkatram and Ediger, Mark D. and de Pablo, Juan J.},
abstractNote = {},
doi = {10.1021/acscentsci.7b00041},
journal = {ACS Central Science},
number = 5,
volume = 3,
place = {United States},
year = {2017},
month = {4}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1021/acscentsci.7b00041

Citation Metrics:
Cited by: 5 works
Citation information provided by
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