Orientation mapping of semicrystalline polymers using scanning electron nanobeam diffraction
Abstract
Here, we demonstrate a scanning electron nanobeam diffraction technique that can be used for mapping the size and distribution of nanoscale crystalline regions in a polymer blend. In addition, it can map the relative orientation of crystallites and the degree of crystallinity of the material. The model polymer blend is a 50:50 w/w mixture of semicrystalline poly(3-hexylthiophene-2,5-diyl) (P3HT) and amorphous polystyrene (PS). The technique uses a scanning electron beam to raster across the sample and acquires a diffraction image at each probe position. Through image alignment and filtering, the diffraction image dataset enables mapping of the crystalline regions within the scanned area and construction of an orientation map.
- Authors:
-
- University of California, Berkeley, CA (United States); Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States). National Center for Electron Microscopy
- University of California, Berkeley, CA (United States); Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
- Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States). National Center for Electron Microscopy
- Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
- University of California, Berkeley, CA (United States); Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States). Materials Sciences Division and Joint Center for Energy Storage Research (JCESR)
- Publication Date:
- Research Org.:
- Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division; USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22). Materials Sciences & Engineering Division
- OSTI Identifier:
- 1474961
- Alternate Identifier(s):
- OSTI ID: 1351660
- Grant/Contract Number:
- AC02-05CH11231
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Micron
- Additional Journal Information:
- Journal Volume: 88; Journal Issue: C; Related Information: © 2016 Elsevier Ltd.; Journal ID: ISSN 0968-4328
- Publisher:
- Elsevier
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; 77 NANOSCIENCE AND NANOTECHNOLOGY; TEM; STEM; spatially resolved; diffraction; crystal orientation; P3HT; polymers; locally resolved structure
Citation Formats
Panova, Ouliana, Chen, X. Chelsea, Bustillo, Karen C., Ophus, Colin, Bhatt, Mahesh P., Balsara, Nitash, and Minor, Andrew M. Orientation mapping of semicrystalline polymers using scanning electron nanobeam diffraction. United States: N. p., 2016.
Web. doi:10.1016/j.micron.2016.05.008.
Panova, Ouliana, Chen, X. Chelsea, Bustillo, Karen C., Ophus, Colin, Bhatt, Mahesh P., Balsara, Nitash, & Minor, Andrew M. Orientation mapping of semicrystalline polymers using scanning electron nanobeam diffraction. United States. https://doi.org/10.1016/j.micron.2016.05.008
Panova, Ouliana, Chen, X. Chelsea, Bustillo, Karen C., Ophus, Colin, Bhatt, Mahesh P., Balsara, Nitash, and Minor, Andrew M. Fri .
"Orientation mapping of semicrystalline polymers using scanning electron nanobeam diffraction". United States. https://doi.org/10.1016/j.micron.2016.05.008. https://www.osti.gov/servlets/purl/1474961.
@article{osti_1474961,
title = {Orientation mapping of semicrystalline polymers using scanning electron nanobeam diffraction},
author = {Panova, Ouliana and Chen, X. Chelsea and Bustillo, Karen C. and Ophus, Colin and Bhatt, Mahesh P. and Balsara, Nitash and Minor, Andrew M.},
abstractNote = {Here, we demonstrate a scanning electron nanobeam diffraction technique that can be used for mapping the size and distribution of nanoscale crystalline regions in a polymer blend. In addition, it can map the relative orientation of crystallites and the degree of crystallinity of the material. The model polymer blend is a 50:50 w/w mixture of semicrystalline poly(3-hexylthiophene-2,5-diyl) (P3HT) and amorphous polystyrene (PS). The technique uses a scanning electron beam to raster across the sample and acquires a diffraction image at each probe position. Through image alignment and filtering, the diffraction image dataset enables mapping of the crystalline regions within the scanned area and construction of an orientation map.},
doi = {10.1016/j.micron.2016.05.008},
journal = {Micron},
number = C,
volume = 88,
place = {United States},
year = {Fri May 27 00:00:00 EDT 2016},
month = {Fri May 27 00:00:00 EDT 2016}
}
Web of Science
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