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Title: A short story of imaging and spectroscopy of two-dimensional materials by scanning transmission electron microscopy

Here we present a short historical account of when single adatom impurities where first identified in two-dimensional materials by scanning transmission electron microscopy (STEM). We also present a study of the graphene low-loss (below 50 eV) response as a function of number of layers using electron energy-loss spectroscopy (EELS). The study shows that as few as three layers of graphene behave as bulk graphite for losses above 10 eV We also show examples of how point and extended defects can easily be resolved and structural dynamics can be readily capture by using aberration-corrected STEM imaging. Lastly, we show that the new generation of monochromators has opened up possibilities to explore new physics with an electron microscope. All these capabilities were enabled by the development of spherical aberration correctors and monochromators, where Ondrej Krivanek has played a key role.
Authors:
 [1] ;  [2]
  1. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
  2. Univ. of Chinese Academy of Science, Beijing (China)
Publication Date:
Grant/Contract Number:
AC05-00OR22725
Type:
Accepted Manuscript
Journal Name:
Ultramicroscopy
Additional Journal Information:
Journal Volume: 180; Journal ID: ISSN 0304-3991
Publisher:
Elsevier
Research Org:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
Sponsoring Org:
USDOE Office of Science (SC)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; STEM; EELS; 2D materials; aberration correction; graphene; boron nitride; molybdenum disulfide
OSTI Identifier:
1350940

Idrobo Tapia, Juan Carlos, and Zhou, Wu. A short story of imaging and spectroscopy of two-dimensional materials by scanning transmission electron microscopy. United States: N. p., Web. doi:10.1016/j.ultramic.2017.02.002.
Idrobo Tapia, Juan Carlos, & Zhou, Wu. A short story of imaging and spectroscopy of two-dimensional materials by scanning transmission electron microscopy. United States. doi:10.1016/j.ultramic.2017.02.002.
Idrobo Tapia, Juan Carlos, and Zhou, Wu. 2017. "A short story of imaging and spectroscopy of two-dimensional materials by scanning transmission electron microscopy". United States. doi:10.1016/j.ultramic.2017.02.002. https://www.osti.gov/servlets/purl/1350940.
@article{osti_1350940,
title = {A short story of imaging and spectroscopy of two-dimensional materials by scanning transmission electron microscopy},
author = {Idrobo Tapia, Juan Carlos and Zhou, Wu},
abstractNote = {Here we present a short historical account of when single adatom impurities where first identified in two-dimensional materials by scanning transmission electron microscopy (STEM). We also present a study of the graphene low-loss (below 50 eV) response as a function of number of layers using electron energy-loss spectroscopy (EELS). The study shows that as few as three layers of graphene behave as bulk graphite for losses above 10 eV We also show examples of how point and extended defects can easily be resolved and structural dynamics can be readily capture by using aberration-corrected STEM imaging. Lastly, we show that the new generation of monochromators has opened up possibilities to explore new physics with an electron microscope. All these capabilities were enabled by the development of spherical aberration correctors and monochromators, where Ondrej Krivanek has played a key role.},
doi = {10.1016/j.ultramic.2017.02.002},
journal = {Ultramicroscopy},
number = ,
volume = 180,
place = {United States},
year = {2017},
month = {3}
}