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Title: Current-induced surface roughness reduction in conducting thin films

Authors:
ORCiD logo [1] ;  [1]
  1. Department of Chemical Engineering, University of Massachusetts, Amherst, Massachusetts 01003-9303, USA
Publication Date:
Grant/Contract Number:
FG02-07ER46407
Type:
Publisher's Accepted Manuscript
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 110; Journal Issue: 10; Related Information: CHORUS Timestamp: 2018-02-14 11:24:41; Journal ID: ISSN 0003-6951
Publisher:
American Institute of Physics
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
OSTI Identifier:
1349360