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Title: Photovoltaic failure and degradation modes

Abstract

The extensive photovoltaic field reliability literature was analyzed and reviewed. Future work is prioritized based upon information assembled from recent installations, and inconsistencies in degradation mode identification are discussed to help guide future publication on this subject. Reported failure rates of photovoltaic modules fall mostly in the range of other consumer products; however, the long expected useful life of modules may not allow for direct comparison. In general, degradation percentages are reported to decrease appreciably in newer installations that are deployed after the year 2000. However, these trends may be convoluted with varying manufacturing and installation quality world-wide. Modules in hot and humid climates show considerably higher degradation modes than those in desert and moderate climates, which warrants further investigation. Delamination and diode/j-box issues are also more frequent in hot and humid climates than in other climates. The highest concerns of systems installed in the last 10 years appear to be hot spots followed by internal circuitry discoloration. Encapsulant discoloration was the most common degradation mode, particularly in older systems. In newer systems, encapsulant discoloration appears in hotter climates, but to a lesser degree. Lastly, thin-film degradation modes are dominated by glass breakage and absorber corrosion, although the breadth ofmore » information for thin-film modules is much smaller than for x-Si.« less

Authors:
ORCiD logo [1];  [1];  [1];  [1];  [2]
  1. National Renewable Energy Lab. (NREL), Golden, CO (United States)
  2. Colorado School of Mines, Golden, CO (United States)
Publication Date:
Research Org.:
National Renewable Energy Lab. (NREL), Golden, CO (United States)
Sponsoring Org.:
USDOE Office of Energy Efficiency and Renewable Energy (EERE), Solar Energy Technologies Office (EE-4S)
OSTI Identifier:
1349023
Alternate Identifier(s):
OSTI ID: 1401511
Report Number(s):
NREL/JA-5J00-67238
Journal ID: ISSN 1062-7995
Grant/Contract Number:  
AC36-08GO28308; AC36-08-GO28308
Resource Type:
Accepted Manuscript
Journal Name:
Progress in Photovoltaics
Additional Journal Information:
Journal Volume: 25; Journal Issue: 4; Journal ID: ISSN 1062-7995
Publisher:
Wiley
Country of Publication:
United States
Language:
English
Subject:
14 SOLAR ENERGY; 47 OTHER INSTRUMENTATION; photovoltaic modules; reliability; durability; failure; failure rate; degradation modes

Citation Formats

Jordan, Dirk C., Silverman, Timothy J., Wohlgemuth, John H., Kurtz, Sarah R., and VanSant, Kaitlyn T. Photovoltaic failure and degradation modes. United States: N. p., 2017. Web. doi:10.1002/pip.2866.
Jordan, Dirk C., Silverman, Timothy J., Wohlgemuth, John H., Kurtz, Sarah R., & VanSant, Kaitlyn T. Photovoltaic failure and degradation modes. United States. doi:10.1002/pip.2866.
Jordan, Dirk C., Silverman, Timothy J., Wohlgemuth, John H., Kurtz, Sarah R., and VanSant, Kaitlyn T. Mon . "Photovoltaic failure and degradation modes". United States. doi:10.1002/pip.2866. https://www.osti.gov/servlets/purl/1349023.
@article{osti_1349023,
title = {Photovoltaic failure and degradation modes},
author = {Jordan, Dirk C. and Silverman, Timothy J. and Wohlgemuth, John H. and Kurtz, Sarah R. and VanSant, Kaitlyn T.},
abstractNote = {The extensive photovoltaic field reliability literature was analyzed and reviewed. Future work is prioritized based upon information assembled from recent installations, and inconsistencies in degradation mode identification are discussed to help guide future publication on this subject. Reported failure rates of photovoltaic modules fall mostly in the range of other consumer products; however, the long expected useful life of modules may not allow for direct comparison. In general, degradation percentages are reported to decrease appreciably in newer installations that are deployed after the year 2000. However, these trends may be convoluted with varying manufacturing and installation quality world-wide. Modules in hot and humid climates show considerably higher degradation modes than those in desert and moderate climates, which warrants further investigation. Delamination and diode/j-box issues are also more frequent in hot and humid climates than in other climates. The highest concerns of systems installed in the last 10 years appear to be hot spots followed by internal circuitry discoloration. Encapsulant discoloration was the most common degradation mode, particularly in older systems. In newer systems, encapsulant discoloration appears in hotter climates, but to a lesser degree. Lastly, thin-film degradation modes are dominated by glass breakage and absorber corrosion, although the breadth of information for thin-film modules is much smaller than for x-Si.},
doi = {10.1002/pip.2866},
journal = {Progress in Photovoltaics},
number = 4,
volume = 25,
place = {United States},
year = {2017},
month = {1}
}

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Works referenced in this record:

Investigation of Dominant Failure Mode(s) for Field-Aged Crystalline Silicon PV Modules Under Desert Climatic Conditions
journal, May 2014


Analysis of the degradation and aging of a commercial photovoltaic installation
conference, October 2014

  • Bradley, Alexander; Hamzavy, Babak; Gambogi, William
  • SPIE Solar Energy + Technology, SPIE Proceedings
  • DOI: 10.1117/12.2062046

PV degradation curves: non-linearities and failure modes: PV degradation curves: non-linearities and failure modes
journal, September 2016

  • Jordan, Dirk C.; Silverman, Timothy J.; Sekulic, Bill
  • Progress in Photovoltaics: Research and Applications, Vol. 25, Issue 7
  • DOI: 10.1002/pip.2835

Degradation analysis of 1900 PV modules in a hot-dry climate: Results after 12 to 18 years of field exposure
conference, June 2013

  • Singh, Jaspreet; Belmont, Jonathan; TamizhMani, GovindaSamy
  • 2013 IEEE 39th Photovoltaic Specialists Conference (PVSC)
  • DOI: 10.1109/PVSC.2013.6745149

Photovoltaic Degradation Rates-an Analytical Review: Photovoltaic degradation rates
journal, October 2011

  • Jordan, D. C.; Kurtz, S. R.
  • Progress in Photovoltaics: Research and Applications, Vol. 21, Issue 1
  • DOI: 10.1002/pip.1182

Compendium of photovoltaic degradation rates: Photovoltaic degradation rates
journal, February 2016

  • Jordan, Dirk C.; Kurtz, Sarah R.; VanSant, Kaitlyn
  • Progress in Photovoltaics: Research and Applications, Vol. 24, Issue 7
  • DOI: 10.1002/pip.2744

Pitfalls of accelerated testing
journal, June 1998

  • Meeker, W. Q.; Escobar, L. A.
  • IEEE Transactions on Reliability, Vol. 47, Issue 2
  • DOI: 10.1109/24.722271

Validation of the PVLife model using 3 million module-years of live site data
conference, June 2013

  • Hasselbrink, Ernest; Anderson, Mike; Defreitas, Zoe
  • 2013 IEEE 39th Photovoltaic Specialists Conference (PVSC)
  • DOI: 10.1109/PVSC.2013.6744087

Defect and safety inspection of 6 PV technologies from 56,000 modules representing 257,000 modules in 4 climatic regions of the United States
conference, June 2016

  • Tatapudi, Sai; Libby, Cara; Raupp, Christopher
  • 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC)
  • DOI: 10.1109/PVSC.2016.7749923

Outdoor PV degradation comparison
conference, June 2010

  • Jordan, D. C.; Smith, R. M.; Osterwald, C. R.
  • 2010 35th IEEE Photovoltaic Specialists Conference (PVSC)
  • DOI: 10.1109/PVSC.2010.5616925