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Title: Measuring and predicting the diffraction properties of cylindrically bent potassium acid phthalate, KAP(001), crystals

Authors:
ORCiD logo [1];  [1]
  1. National Security Technologies (NSTec), LLC, Livermore, California 94550, USA
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1348266
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Name: Review of Scientific Instruments Journal Volume: 88 Journal Issue: 2; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics
Country of Publication:
United States
Language:
English

Citation Formats

Haugh, M. J., and Jacoby, K. D. Measuring and predicting the diffraction properties of cylindrically bent potassium acid phthalate, KAP(001), crystals. United States: N. p., 2017. Web. doi:10.1063/1.4975775.
Haugh, M. J., & Jacoby, K. D. Measuring and predicting the diffraction properties of cylindrically bent potassium acid phthalate, KAP(001), crystals. United States. doi:10.1063/1.4975775.
Haugh, M. J., and Jacoby, K. D. Wed . "Measuring and predicting the diffraction properties of cylindrically bent potassium acid phthalate, KAP(001), crystals". United States. doi:10.1063/1.4975775.
@article{osti_1348266,
title = {Measuring and predicting the diffraction properties of cylindrically bent potassium acid phthalate, KAP(001), crystals},
author = {Haugh, M. J. and Jacoby, K. D.},
abstractNote = {},
doi = {10.1063/1.4975775},
journal = {Review of Scientific Instruments},
number = 2,
volume = 88,
place = {United States},
year = {2017},
month = {2}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1063/1.4975775

Citation Metrics:
Cited by: 1 work
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Works referenced in this record:

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