Nanoscale imaging of alteration layers of corroded international simple glass particles using ToF-SIMS
Abstract
Glass particles with dimensions typically ranging from tens to hundreds of microns are often used in glass corrosion research in order to accelerate testing. Two-dimensional and three-dimensional nanoscale imaging techniques are badly needed to characterize the alteration layers at the surfaces of these corroded glass particles. Time-of-flight secondary ion mass spectrometry (ToF-SIMS) can provide a lateral resolution as low as ~100 nm, and, compared to other imaging techniques, is sensitive to elements lighter than carbon. Here, we used ToF-SIMS to characterize the alteration layers of corroded international simple glass (ISG) particles. At most particle surfaces, we observed inhomogeneous or no alteration layers, indicating that the thickness of the alterations layers may be too thin to be observable by ToF-SIMS imaging. Relatively thick (e.g., 1–10 µm) alteration layers were inhomogeneously distributed at a small portion of surfaces.Interestingly, some large-size (tens of microns) glass particles were fully altered. Above observations suggest that weak attachment and the defects on ISG particle surfaces play an important role in ISG glass corrosion.
- Authors:
-
- Lanzhou Univ., Gansu (China). School of Nuclear Science and Technology; Pacific Northwest National Lab. (PNNL), Richland, WA (United States). W.R. Wiley Environmental Molecular Sciences Lab.
- Pacific Northwest National Lab. (PNNL), Richland, WA (United States). Energy and Environment Directorate
- Pacific Northwest National Lab. (PNNL), Richland, WA (United States). W.R. Wiley Environmental Molecular Sciences Lab.
- Lanzhou Univ., Gansu (China). School of Nuclear Science and Technology
- Publication Date:
- Research Org.:
- Pacific Northwest National Lab. (PNNL), Richland, WA (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1347957
- Grant/Contract Number:
- AC057601830; FG02-91ER40688; SC0010010
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Additional Journal Information:
- Journal Volume: 851; Journal Issue: C; Journal ID: ISSN 0168-583X
- Publisher:
- Elsevier
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ToF-SIMS; Nanoscale imaging; Glass corrosion; Alteration layer; ISG particles
Citation Formats
Zhang, Jiandong, Neeway, James J., Zhang, Yanyan, Ryan, Joseph V., Yuan, Wei, Wang, Tieshan, and Zhu, Zihua. Nanoscale imaging of alteration layers of corroded international simple glass particles using ToF-SIMS. United States: N. p., 2017.
Web. doi:10.1016/j.nimb.2017.01.053.
Zhang, Jiandong, Neeway, James J., Zhang, Yanyan, Ryan, Joseph V., Yuan, Wei, Wang, Tieshan, & Zhu, Zihua. Nanoscale imaging of alteration layers of corroded international simple glass particles using ToF-SIMS. United States. https://doi.org/10.1016/j.nimb.2017.01.053
Zhang, Jiandong, Neeway, James J., Zhang, Yanyan, Ryan, Joseph V., Yuan, Wei, Wang, Tieshan, and Zhu, Zihua. Fri .
"Nanoscale imaging of alteration layers of corroded international simple glass particles using ToF-SIMS". United States. https://doi.org/10.1016/j.nimb.2017.01.053. https://www.osti.gov/servlets/purl/1347957.
@article{osti_1347957,
title = {Nanoscale imaging of alteration layers of corroded international simple glass particles using ToF-SIMS},
author = {Zhang, Jiandong and Neeway, James J. and Zhang, Yanyan and Ryan, Joseph V. and Yuan, Wei and Wang, Tieshan and Zhu, Zihua},
abstractNote = {Glass particles with dimensions typically ranging from tens to hundreds of microns are often used in glass corrosion research in order to accelerate testing. Two-dimensional and three-dimensional nanoscale imaging techniques are badly needed to characterize the alteration layers at the surfaces of these corroded glass particles. Time-of-flight secondary ion mass spectrometry (ToF-SIMS) can provide a lateral resolution as low as ~100 nm, and, compared to other imaging techniques, is sensitive to elements lighter than carbon. Here, we used ToF-SIMS to characterize the alteration layers of corroded international simple glass (ISG) particles. At most particle surfaces, we observed inhomogeneous or no alteration layers, indicating that the thickness of the alterations layers may be too thin to be observable by ToF-SIMS imaging. Relatively thick (e.g., 1–10 µm) alteration layers were inhomogeneously distributed at a small portion of surfaces.Interestingly, some large-size (tens of microns) glass particles were fully altered. Above observations suggest that weak attachment and the defects on ISG particle surfaces play an important role in ISG glass corrosion.},
doi = {10.1016/j.nimb.2017.01.053},
journal = {Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms},
number = C,
volume = 851,
place = {United States},
year = {Fri Feb 24 00:00:00 EST 2017},
month = {Fri Feb 24 00:00:00 EST 2017}
}
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Works referencing / citing this record:
ToF-SIMS depth profiling of altered glass
journal, April 2019
- Collin, Marie; Gin, Stéphane; Jollivet, Patrick
- npj Materials Degradation, Vol. 3, Issue 1
Nanoscale imaging of hydrogen and sodium in alteration layers of corroded glass using ToF-SIMS: Is an auxiliary sputtering ion beam necessary?
journal, October 2018
- Zhang, Jiandong; Zhang, Yanyan; Collin, Marie
- Surface and Interface Analysis, Vol. 51, Issue 2