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Title: In situ measurement of lithiation-induced stress in silicon nanoparticles using micro-Raman spectroscopy

Authors:
; ; ; ; ;
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1345429
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Nano Energy
Additional Journal Information:
Journal Name: Nano Energy Journal Volume: 22 Journal Issue: C; Journal ID: ISSN 2211-2855
Publisher:
Elsevier
Country of Publication:
Netherlands
Language:
English

Citation Formats

Zeng, Zhidan, Liu, Nian, Zeng, Qiaoshi, Lee, Seok Woo, Mao, Wendy L., and Cui, Yi. In situ measurement of lithiation-induced stress in silicon nanoparticles using micro-Raman spectroscopy. Netherlands: N. p., 2016. Web. doi:10.1016/j.nanoen.2016.02.005.
Zeng, Zhidan, Liu, Nian, Zeng, Qiaoshi, Lee, Seok Woo, Mao, Wendy L., & Cui, Yi. In situ measurement of lithiation-induced stress in silicon nanoparticles using micro-Raman spectroscopy. Netherlands. doi:10.1016/j.nanoen.2016.02.005.
Zeng, Zhidan, Liu, Nian, Zeng, Qiaoshi, Lee, Seok Woo, Mao, Wendy L., and Cui, Yi. Fri . "In situ measurement of lithiation-induced stress in silicon nanoparticles using micro-Raman spectroscopy". Netherlands. doi:10.1016/j.nanoen.2016.02.005.
@article{osti_1345429,
title = {In situ measurement of lithiation-induced stress in silicon nanoparticles using micro-Raman spectroscopy},
author = {Zeng, Zhidan and Liu, Nian and Zeng, Qiaoshi and Lee, Seok Woo and Mao, Wendy L. and Cui, Yi},
abstractNote = {},
doi = {10.1016/j.nanoen.2016.02.005},
journal = {Nano Energy},
number = C,
volume = 22,
place = {Netherlands},
year = {2016},
month = {4}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1016/j.nanoen.2016.02.005

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Cited by: 14 works
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