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Title: White-beam X-ray diffraction and radiography studies on high-boron-containing borosilicate glass at high pressures

Multi-angle energy-dispersive X-ray diffraction studies and white-beam X-ray radiography were conducted with a cylindrically shaped (1 mm diameter and 0.7 mm high) high-boron-content borosilicate glass sample (17.6% B 2O 3) to a pressure of 13.7 GPa using a Paris-Edinburgh (PE) press at Beamline 16-BM-B, HPCAT of the Advanced Photon Source. The measured structure factor S(q) to large q = 19 Å –1 is used to determine information about the internuclear bond distances between various species of atoms within the glass sample. Sample pressure was determined with gold as a pressure standard. The sample height as measured by radiography showed an overall uniaxial compression of 22.5% at 13.7 GPa with 10.6% permanent compaction after decompression to ambient conditions. The reduced pair distribution function G(r) was extracted and Si–O, O–O and Si–Si bond distances were measured as a function of pressure. Lastly, Raman spectroscopy of the pressure recovered sample as compared to starting material showed blue-shift and changes in intensity and widths of Raman bands associated with silicate and four-coordinated boron.
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Publication Date:
Grant/Contract Number:
Accepted Manuscript
Journal Name:
High Pressure Research
Additional Journal Information:
Journal Volume: 37; Journal Issue: 2; Journal ID: ISSN 0895-7959
Taylor & Francis
Research Org:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Org:
USDOE; Work for Others (WFO)
Country of Publication:
United States
43 PARTICLE ACCELERATORS; borosilicate glass; Paris-Edinburgh cell; high pressure; X-ray diffraction
OSTI Identifier: