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Title: Ideal Scan Path for High-Speed Atomic Force Microscopy

Authors:
; ; ; ;
Publication Date:
Grant/Contract Number:
AC02-05CH11231
Type:
Published Article
Journal Name:
IEEE/ASME Transactions on Mechatronics
Additional Journal Information:
Journal Name: IEEE/ASME Transactions on Mechatronics Journal Volume: 22 Journal Issue: 1; Journal ID: ISSN 1083-4435
Publisher:
Institute of Electrical and Electronics Engineers
Sponsoring Org:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
Country of Publication:
United States
Language:
English
OSTI Identifier:
1343646
Alternate Identifier(s):
OSTI ID: 1343647

Ziegler, Dominik, Meyer, Travis R., Amrein, Andreas, Bertozzi, Andrea L., and Ashby, Paul D.. Ideal Scan Path for High-Speed Atomic Force Microscopy. United States: N. p., Web. doi:10.1109/TMECH.2016.2615327.
Ziegler, Dominik, Meyer, Travis R., Amrein, Andreas, Bertozzi, Andrea L., & Ashby, Paul D.. Ideal Scan Path for High-Speed Atomic Force Microscopy. United States. doi:10.1109/TMECH.2016.2615327.
Ziegler, Dominik, Meyer, Travis R., Amrein, Andreas, Bertozzi, Andrea L., and Ashby, Paul D.. 2017. "Ideal Scan Path for High-Speed Atomic Force Microscopy". United States. doi:10.1109/TMECH.2016.2615327.
@article{osti_1343646,
title = {Ideal Scan Path for High-Speed Atomic Force Microscopy},
author = {Ziegler, Dominik and Meyer, Travis R. and Amrein, Andreas and Bertozzi, Andrea L. and Ashby, Paul D.},
abstractNote = {},
doi = {10.1109/TMECH.2016.2615327},
journal = {IEEE/ASME Transactions on Mechatronics},
number = 1,
volume = 22,
place = {United States},
year = {2017},
month = {2}
}