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Title: Ideal Scan Path for High-Speed Atomic Force Microscopy

Authors:
; ; ; ;
Publication Date:
Grant/Contract Number:
AC02-05CH11231
Type:
Published Article
Journal Name:
IEEE/ASME Transactions on Mechatronics
Additional Journal Information:
Journal Volume: 22; Journal Issue: 1; Related Information: CHORUS Timestamp: 2017-02-14 15:01:49; Journal ID: ISSN 1083-4435
Publisher:
Institute of Electrical and Electronics Engineers
Sponsoring Org:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
Country of Publication:
United States
Language:
English
OSTI Identifier:
1343646
Alternate Identifier(s):
OSTI ID: 1343647