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Title: Spatial luminescence imaging of dopant incorporation in CdTe Films

State-of-the-art cathodoluminescence (CL) spectrum imaging with spectrum-per-pixel CL emission mapping is applied to spatially profile how dopant elements are incorporated into Cadmium telluride (CdTe). Emission spectra and intensity monitor the spatial distribution of additional charge carriers through characteristic variations in the CL emission based on computational modeling. Our results show that grain boundaries play a role in incorporating dopants in CdTe exposed to copper, phosphorus, and intrinsic point defects in CdTe. Furthermore, the image analysis provides critical, unique feedback to understand dopant incorporation and activation in the inhomogeneous CdTe material, which has struggled to reach high levels of hole density.
Authors:
 [1] ;  [1] ;  [1] ;  [1] ;  [1] ;  [1] ;  [1]
  1. National Renewable Energy Lab. (NREL), Golden, CO (United States)
Publication Date:
Report Number(s):
NREL/JA-5K00-67135
Journal ID: ISSN 0021-8979
Grant/Contract Number:
AC36-08GO28308
Type:
Accepted Manuscript
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Volume: 121; Journal Issue: 4; Journal ID: ISSN 0021-8979
Publisher:
American Institute of Physics (AIP)
Research Org:
National Renewable Energy Lab. (NREL), Golden, CO (United States)
Sponsoring Org:
USDOE Office of Energy Efficiency and Renewable Energy (EERE), Solar Energy Technologies Office (EE-4S)
Country of Publication:
United States
Language:
English
Subject:
14 SOLAR ENERGY; 36 MATERIALS SCIENCE; cadmium telluride; cathodoluminescence; dopant distribution; grain boundaries
OSTI Identifier:
1342822
Alternate Identifier(s):
OSTI ID: 1361747

Guthrey, Harvey, Moseley, John, Colegrove, Eric, Burst, James, Albin, David, Metzger, Wyatt K., and Al-Jassim, Mowafak. Spatial luminescence imaging of dopant incorporation in CdTe Films. United States: N. p., Web. doi:10.1063/1.4974459.
Guthrey, Harvey, Moseley, John, Colegrove, Eric, Burst, James, Albin, David, Metzger, Wyatt K., & Al-Jassim, Mowafak. Spatial luminescence imaging of dopant incorporation in CdTe Films. United States. doi:10.1063/1.4974459.
Guthrey, Harvey, Moseley, John, Colegrove, Eric, Burst, James, Albin, David, Metzger, Wyatt K., and Al-Jassim, Mowafak. 2017. "Spatial luminescence imaging of dopant incorporation in CdTe Films". United States. doi:10.1063/1.4974459. https://www.osti.gov/servlets/purl/1342822.
@article{osti_1342822,
title = {Spatial luminescence imaging of dopant incorporation in CdTe Films},
author = {Guthrey, Harvey and Moseley, John and Colegrove, Eric and Burst, James and Albin, David and Metzger, Wyatt K. and Al-Jassim, Mowafak},
abstractNote = {State-of-the-art cathodoluminescence (CL) spectrum imaging with spectrum-per-pixel CL emission mapping is applied to spatially profile how dopant elements are incorporated into Cadmium telluride (CdTe). Emission spectra and intensity monitor the spatial distribution of additional charge carriers through characteristic variations in the CL emission based on computational modeling. Our results show that grain boundaries play a role in incorporating dopants in CdTe exposed to copper, phosphorus, and intrinsic point defects in CdTe. Furthermore, the image analysis provides critical, unique feedback to understand dopant incorporation and activation in the inhomogeneous CdTe material, which has struggled to reach high levels of hole density.},
doi = {10.1063/1.4974459},
journal = {Journal of Applied Physics},
number = 4,
volume = 121,
place = {United States},
year = {2017},
month = {1}
}