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Title: Modal phase measuring deflectometry

Here in this work, a model based method is applied to phase measuring deflectometry, which is named as modal phase measuring deflectometry. The height and slopes of the surface under test are represented by mathematical models and updated by optimizing the model coefficients to minimize the discrepancy between the reprojection in ray tracing and the actual measurement. The pose of the screen relative to the camera is pre-calibrated and further optimized together with the shape coefficients of the surface under test. Simulations and experiments are conducted to demonstrate the feasibility of the proposed approach.
Authors:
 [1] ;  [2] ;  [3] ;  [4] ;  [4] ;  [1]
  1. Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II)
  2. Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II); Sichuan Univ., Chengdu (China). School of Aeronautics and Astronautics
  3. Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II); Chinese Academy of Sciences (CAS), Shanghai (China). Shanghai Inst. of Applied Physics; Univ. of Chines e Academy of Sciences , Beijing (China)
  4. Arizona Optical Systems, Tucson, AZ (United States)
Publication Date:
Report Number(s):
BNL-113457-2017-JA
Journal ID: ISSN 1094-4087; OPEXFF
Grant/Contract Number:
SC0012704
Type:
Accepted Manuscript
Journal Name:
Optics Express
Additional Journal Information:
Journal Volume: 24; Journal Issue: 21; Journal ID: ISSN 1094-4087
Publisher:
Optical Society of America (OSA)
Research Org:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Org:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING
OSTI Identifier:
1341707