Modal phase measuring deflectometry
Abstract
Here in this work, a model based method is applied to phase measuring deflectometry, which is named as modal phase measuring deflectometry. The height and slopes of the surface under test are represented by mathematical models and updated by optimizing the model coefficients to minimize the discrepancy between the reprojection in ray tracing and the actual measurement. The pose of the screen relative to the camera is pre-calibrated and further optimized together with the shape coefficients of the surface under test. Simulations and experiments are conducted to demonstrate the feasibility of the proposed approach.
- Authors:
-
- Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II)
- Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II); Sichuan Univ., Chengdu (China). School of Aeronautics and Astronautics
- Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II); Chinese Academy of Sciences (CAS), Shanghai (China). Shanghai Inst. of Applied Physics; Univ. of Chines e Academy of Sciences , Beijing (China)
- Arizona Optical Systems, Tucson, AZ (United States)
- Publication Date:
- Research Org.:
- Brookhaven National Lab. (BNL), Upton, NY (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- OSTI Identifier:
- 1341707
- Report Number(s):
- BNL-113457-2017-JA
Journal ID: ISSN 1094-4087; OPEXFF
- Grant/Contract Number:
- SC0012704
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Optics Express
- Additional Journal Information:
- Journal Volume: 24; Journal Issue: 21; Journal ID: ISSN 1094-4087
- Publisher:
- Optical Society of America (OSA)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 42 ENGINEERING
Citation Formats
Huang, Lei, Xue, Junpeng, Gao, Bo, McPherson, Chris, Beverage, Jacob, and Idir, Mourad. Modal phase measuring deflectometry. United States: N. p., 2016.
Web. doi:10.1364/OE.24.024649.
Huang, Lei, Xue, Junpeng, Gao, Bo, McPherson, Chris, Beverage, Jacob, & Idir, Mourad. Modal phase measuring deflectometry. United States. https://doi.org/10.1364/OE.24.024649
Huang, Lei, Xue, Junpeng, Gao, Bo, McPherson, Chris, Beverage, Jacob, and Idir, Mourad. Fri .
"Modal phase measuring deflectometry". United States. https://doi.org/10.1364/OE.24.024649. https://www.osti.gov/servlets/purl/1341707.
@article{osti_1341707,
title = {Modal phase measuring deflectometry},
author = {Huang, Lei and Xue, Junpeng and Gao, Bo and McPherson, Chris and Beverage, Jacob and Idir, Mourad},
abstractNote = {Here in this work, a model based method is applied to phase measuring deflectometry, which is named as modal phase measuring deflectometry. The height and slopes of the surface under test are represented by mathematical models and updated by optimizing the model coefficients to minimize the discrepancy between the reprojection in ray tracing and the actual measurement. The pose of the screen relative to the camera is pre-calibrated and further optimized together with the shape coefficients of the surface under test. Simulations and experiments are conducted to demonstrate the feasibility of the proposed approach.},
doi = {10.1364/OE.24.024649},
journal = {Optics Express},
number = 21,
volume = 24,
place = {United States},
year = {Fri Oct 14 00:00:00 EDT 2016},
month = {Fri Oct 14 00:00:00 EDT 2016}
}
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Works referenced in this record:
Principles of interference microscopy for the measurement of surface topography
journal, January 2015
- de Groot, Peter
- Advances in Optics and Photonics, Vol. 7, Issue 1
Overview of three-dimensional shape measurement using optical methods
journal, January 2000
- Brown, Gordon M.
- Optical Engineering, Vol. 39, Issue 1
Phase measuring deflectometry: a new approach to measure specular free-form surfaces
conference, September 2004
- Knauer, Markus C.; Kaminski, Jurgen; Hausler, Gerd
- Photonics Europe, SPIE Proceedings
Reflection grating photogrammetry: a technique for absolute shape measurement of specular free-form surfaces
conference, September 2005
- Petz, Marcus; Tutsch, Rainer
- Optics & Photonics 2005, SPIE Proceedings
High-resolution 3D shape measurement on specular surfaces by fringe reflection
conference, September 2004
- Bothe, Thorsten; Li, Wansong; von Kopylow, Christoph
- Photonics Europe, SPIE Proceedings
Deflectometry challenges interferometry: the competition gets tougher!
conference, September 2012
- Faber, Christian; Olesch, Evelyn; Krobot, Roman
- SPIE Optical Engineering + Applications, SPIE Proceedings
3D shape measurement of the aspheric mirror by advanced phase measuring deflectometry
journal, January 2008
- Tang, Yan; Su, Xianyu; Liu, Yuankun
- Optics Express, Vol. 16, Issue 19
Dynamic three-dimensional sensing for specular surface with monoscopic fringe reflectometry
journal, January 2011
- Huang, Lei; Ng, Chi Seng; Asundi, Anand Krishna
- Optics Express, Vol. 19, Issue 13
Software configurable optical test system: a computerized reverse Hartmann test
journal, January 2010
- Su, Peng; Parks, Robert E.; Wang, Lirong
- Applied Optics, Vol. 49, Issue 23
Non-null full field X-ray mirror metrology using SCOTS: a reflection deflectometry approach
journal, January 2012
- Su, Peng; Wang, Yuhao; Burge, James H.
- Optics Express, Vol. 20, Issue 11
X-ray mirror metrology using SCOTS/deflectometry
conference, September 2013
- Huang, Run; Su, Peng; Burge, James H.
- SPIE Optical Engineering + Applications, SPIE Proceedings
A carrier removal method in phase measuring deflectometry based on the analytical carrier phase description
journal, January 2013
- Yue, Huimin; Wu, Yuxiang; Zhao, Biyu
- Optics Express, Vol. 21, Issue 19
Instrument transfer function of slope measuring deflectometry systems
journal, January 2015
- Su, Tianquan; Maldonado, Alejandro; Su, Peng
- Applied Optics, Vol. 54, Issue 10
Comparison of two-dimensional integration methods for shape reconstruction from gradient data
journal, January 2015
- Huang, Lei; Idir, Mourad; Zuo, Chao
- Optics and Lasers in Engineering, Vol. 64
Shape reconstruction from gradient data
journal, January 2008
- Ettl, Svenja; Kaminski, Jürgen; Knauer, Markus C.
- Applied Optics, Vol. 47, Issue 12
Fast full-field out-of-plane deformation measurement using fringe reflectometry
journal, April 2012
- Huang, Lei; Seng Ng, Chi; Krishna Asundi, Anand
- Optics and Lasers in Engineering, Vol. 50, Issue 4
Absolute optical surface measurement with deflectometry
conference, September 2012
- Li, Wansong; Sandner, Marc; Gesierich, Achim
- SPIE Optical Engineering + Applications, SPIE Proceedings
Mirror Surface Reconstruction from a Single Image
journal, April 2015
- Liu, Miaomiao; Hartley, Richard; Salzmann, Mathieu
- IEEE Transactions on Pattern Analysis and Machine Intelligence, Vol. 37, Issue 4
Flexible geometrical calibration for fringe-reflection 3D measurement
journal, January 2012
- Xiao, Yong-Liang; Su, Xianyu; Chen, Wenjing
- Optics Letters, Vol. 37, Issue 4
Iterative optimization calibration method for stereo deflectometry
journal, January 2015
- Ren, Hongyu; Gao, Feng; Jiang, Xiangqian
- Optics Express, Vol. 23, Issue 17
High-accuracy aspheric x-ray mirror metrology using Software Configurable Optical Test System/deflectometry
journal, August 2015
- Huang, Run; Su, Peng; Burge, James H.
- Optical Engineering, Vol. 54, Issue 8
Modal wavefront reconstruction from its gradient
journal, January 2015
- Mochi, Iacopo; Goldberg, Kenneth A.
- Applied Optics, Vol. 54, Issue 12
Modal wavefront reconstruction based on Zernike polynomials for lateral shearing interferometry: comparisons of existing algorithms
journal, January 2012
- Dai, Fengzhao; Tang, Feng; Wang, Xiangzhao
- Applied Optics, Vol. 51, Issue 21
Modal wave-front reconstruction with Zernike polynomials and Karhunen–Loève functions
journal, January 1996
- Dai, Guang-ming
- Journal of the Optical Society of America A, Vol. 13, Issue 6
Recurrence relations for the Cartesian derivatives of the Zernike polynomials
journal, January 2014
- Stephenson, Philip C. L.
- Journal of the Optical Society of America A, Vol. 31, Issue 4
A generalized temporal phase unwrapping algorithm for three-dimensional profilometry
journal, April 2008
- Tian, Jindong; Peng, Xiang; Zhao, Xiaobo
- Optics and Lasers in Engineering, Vol. 46, Issue 4
Phase invalidity identification framework with the temporal phase unwrapping method
journal, February 2011
- Huang, Lei; Asundi, Anand Krishna
- Measurement Science and Technology, Vol. 22, Issue 3
Temporal phase unwrapping algorithms for fringe projection profilometry: A comparative review
journal, October 2016
- Zuo, Chao; Huang, Lei; Zhang, Minliang
- Optics and Lasers in Engineering, Vol. 85
Works referencing / citing this record:
Full-field 3D shape measurement of discontinuous specular objects by direct phase measuring deflectometry
journal, August 2017
- Liu, Yue; Huang, Shujun; Zhang, Zonghua
- Scientific Reports, Vol. 7, Issue 1
Solution to the slope-height ambiguity problem in phase measuring deflectometry based on a co-axial telecentric optical path
journal, January 2020
- Yue, Hui-Min; Wu, Yu-Xiang; Song, Yi-Ping
- Measurement Science and Technology, Vol. 31, Issue 4
Adaptive wavefront interferometry for unknown free-form surfaces
journal, January 2018
- Xue, Shuai; Chen, Shanyong; Fan, Zhanbin
- Optics Express, Vol. 26, Issue 17
Near-null interferometry using an aspheric null lens generating a broad range of variable spherical aberration for flexible test of aspheres
journal, January 2018
- Xue, Shuai; Chen, Shanyong; Tie, Guipeng
- Optics Express, Vol. 26, Issue 24
Self-calibration of in situ monoscopic deflectometric measurement in precision optical manufacturing
journal, January 2019
- Xu, Xueyang; Zhang, Xiangchao; Niu, Zhenqi
- Optics Express, Vol. 27, Issue 5
Extra-detection-free monoscopic deflectometry for the in situ measurement of freeform specular surfaces
journal, January 2019
- Xu, Xueyang; Zhang, Xiangchao; Niu, Zhenqi
- Optics Letters, Vol. 44, Issue 17
A Calibration Method for System Parameters in Direct Phase Measuring Deflectometry
journal, April 2019
- Deng, Xiaoting; Gao, Nan; Zhang, Zonghua
- Applied Sciences, Vol. 9, Issue 7
Three-Dimensional Shape Measurements of Specular Objects Using Phase-Measuring Deflectometry
journal, December 2017
- Zhang, Zonghua; Wang, Yuemin; Huang, Shujun
- Sensors, Vol. 17, Issue 12
Distance Calibration between Reference Plane and Screen in Direct Phase Measuring Deflectometry
journal, January 2018
- Huang, Shujun; Liu, Yue; Gao, Nan
- Sensors, Vol. 18, Issue 2
Measurement of the Three-Dimensional Shape of Discontinuous Specular Objects Using Infrared Phase-Measuring Deflectometry
journal, October 2019
- Chang, Caixia; Zhang, Zonghua; Gao, Nan
- Sensors, Vol. 19, Issue 21
An Accurate Calibration Means for the Phase Measuring Deflectometry System
journal, December 2019
- Han, Hao; Wu, Shiqian; Song, Zhan
- Sensors, Vol. 19, Issue 24