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Title: Controllable piezoelectricity of Pb(Zr 0.2Ti 0.8)O 3 film via in situ misfit strain

In this paper, the tetragonality (c/a) of a PbZr 0.2Ti 0.8O 3 (PZT) thin film on La 0.7Sr 0.3MnO 3/0.72Pb(Mg 1/3Nb 2/3)O 3-0.28PbTiO 3 (PMN-PT) substrates was controlled by applying an electric field on the PMN-PT substrate. The piezoelectric response of the PZT thin film under various biaxial strains was observed using time-resolved micro X-ray diffraction. The longitudinal piezoelectric coefficient (d 33) was reduced from 29.5 to 14.9 pm/V when the c/a ratio of the PZT film slightly changed from 1.051 to 1.056. Finally, our results demonstrate that the tetragonality of the PZT thin film plays a critical role in determining d 33, and in situ strain engineering using electromechanical substrate is useful in excluding the extrinsic effect resulting from the variation in the film thickness or the interface between substrate.
Authors:
 [1] ;  [2] ;  [3] ;  [1] ;  [1] ;  [4] ;  [5] ;  [1]
  1. Gwangju Inst. of Science and Technology (Korea, Republic of). School of Materials Science and Engineering
  2. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Quantum Condensed Matter Division
  3. (Germany). Inst. for Physics
  4. Martin Luther Univ. of Halle-Wittenberg, Halle (Germany). Inst. for Physics
  5. Ulsan Inst. of Science and Technology (Korea, Republic of). School of Energy and Chemical Engineering
Publication Date:
Grant/Contract Number:
AC05-00OR22725; NRF-2014R1A1A3053111; SFB 762
Type:
Accepted Manuscript
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 110; Journal Issue: 3; Journal ID: ISSN 0003-6951
Publisher:
American Institute of Physics (AIP)
Research Org:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States); Gwangju Inst. of Science and Technology (Korea, Republic of); Martin Luther Univ. of Halle-Wittenberg, Halle (Germany)
Sponsoring Org:
USDOE Laboratory Directed Research and Development (LDRD) Program; National Research Foundation of Korea (NRF); Gwangju Inst. of Science and Technology (Korea, Republic of); POSCO TJ Park Foundation (Korea, Republic of); German Research Foundation (DFG)
Contributing Orgs:
Ulsan Inst. of Science and Technology (Korea, Republic of)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; PZT films; piezoelectric fields; piezoelectric transducers; ferroelectric thin films; thin film structure
OSTI Identifier:
1340448