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Title: Surface studies of solids using integral x-ray-induced photoemission yield

X-ray induced photoemission yield contains structural information complementary to that provided by X-ray Fresnel reflectivity, which presents an advantage to a wide variety of surface studies if this information is made easily accessible. Photoemission in materials research is commonly acknowledged as a method with a probing depth limited by the escape depth of the photoelectrons. Here we show that the integral hard-X-ray-induced photoemission yield is modulated by the Fresnel reflectivity of a multilayer structure and carries structural information that extends well beyond the photoelectron escape depth. A simple electric self-detection of the integral photoemission yield and Fourier data analysis permit extraction of thicknesses of individual layers. The approach does not require detection of the reflected radiation and can be considered as a framework for non-invasive evaluation of buried layers with hard X-rays under grazing incidence.
Authors:
 [1] ;  [2] ;  [3]
  1. Cornell Univ., Ithaca, NY (United States); Argonne National Lab. (ANL), Lemont, IL (United States). Advanced Photon Source (APS)
  2. Brookhaven National Lab. (BNL), Upton, NY (United States)
  3. Argonne National Lab. (ANL), Lemont, IL (United States). Advanced Photon Source (APS)
Publication Date:
Report Number(s):
BNL-113259-2016-JA
Journal ID: ISSN 2045-2322
Grant/Contract Number:
SC00112704; AC02-06CH11357
Type:
Accepted Manuscript
Journal Name:
Scientific Reports
Additional Journal Information:
Journal Volume: 5; Journal ID: ISSN 2045-2322
Publisher:
Nature Publishing Group
Research Org:
Brookhaven National Laboratory (BNL), Upton, NY (United States); Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22); Argonne National Laboratory, Advanced Photon Source
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE
OSTI Identifier:
1340414
Alternate Identifier(s):
OSTI ID: 1373887

Stoupin, Stanislav, Zhernenkov, Mikhail, and Shi, Bing. Surface studies of solids using integral x-ray-induced photoemission yield. United States: N. p., Web. doi:10.1038/srep37440.
Stoupin, Stanislav, Zhernenkov, Mikhail, & Shi, Bing. Surface studies of solids using integral x-ray-induced photoemission yield. United States. doi:10.1038/srep37440.
Stoupin, Stanislav, Zhernenkov, Mikhail, and Shi, Bing. 2016. "Surface studies of solids using integral x-ray-induced photoemission yield". United States. doi:10.1038/srep37440. https://www.osti.gov/servlets/purl/1340414.
@article{osti_1340414,
title = {Surface studies of solids using integral x-ray-induced photoemission yield},
author = {Stoupin, Stanislav and Zhernenkov, Mikhail and Shi, Bing},
abstractNote = {X-ray induced photoemission yield contains structural information complementary to that provided by X-ray Fresnel reflectivity, which presents an advantage to a wide variety of surface studies if this information is made easily accessible. Photoemission in materials research is commonly acknowledged as a method with a probing depth limited by the escape depth of the photoelectrons. Here we show that the integral hard-X-ray-induced photoemission yield is modulated by the Fresnel reflectivity of a multilayer structure and carries structural information that extends well beyond the photoelectron escape depth. A simple electric self-detection of the integral photoemission yield and Fourier data analysis permit extraction of thicknesses of individual layers. The approach does not require detection of the reflected radiation and can be considered as a framework for non-invasive evaluation of buried layers with hard X-rays under grazing incidence.},
doi = {10.1038/srep37440},
journal = {Scientific Reports},
number = ,
volume = 5,
place = {United States},
year = {2016},
month = {11}
}