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Title: Construction of a quartz spherical analyzer: application to high-resolution analysis of the Ni Kα emission spectrum

The construction and characterization of a focusing X-ray spherical analyzer based on α-quartz 4$$\overline{4}$$04 are presented. For this study, the performance of the analyzer was demonstrated by applying it to a high-resolution X-ray spectroscopy study of theKα 1,2emission spectrum of Ni. An analytical representation based on physical grounds was assumed to model the shape of the X-ray emission lines. Satellite structures assigned to 3dspectator hole transitions were resolved and determined as well as their relative contribution to the emission spectrum. The present results on 1s -13d -1shake probabilities support a recently proposed calculation framework based on a multi-configuration atomic model.
Authors:
 [1] ;  [2] ;  [3] ;  [4] ;  [5] ; ORCiD logo [6] ;  [7]
  1. Universidade Federal da Integracao Latino-Americana (Brazil). Instituto de Ciencias da Vida e da Natureza
  2. Universidad Nacional de Cordoba (Argentina). Facultad de Matematica, Astronomia y Fisica
  3. Universidad Nacional de Cordoba (Argentina). Facultad de Matematica, Astronomia y Fisica ; Instituto de Fisica E. Gaviola, CONICET-UNC (Argentina)
  4. Universidade Federal do Parana (Brazil). Departamento de Fisica
  5. Argonne National Lab. (ANL), Argonne, IL (United States). X-ray Science Division
  6. Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source II
  7. Universidad Nacional de Cordoba (Argentina). Facultad de Matematica, Astronomia y Fisica ; Instituto de Fisica E. Gaviola, CONICET-UNC (Argentina)
Publication Date:
Report Number(s):
BNL-112494-2016-JA
Journal ID: ISSN 1600-5767; TRN: US1701731
Grant/Contract Number:
SC00112704; AC02-06CH11357
Type:
Accepted Manuscript
Journal Name:
Journal of Applied Crystallography (Online)
Additional Journal Information:
Journal Name: Journal of Applied Crystallography (Online); Journal Volume: 49; Journal Issue: 5; Journal ID: ISSN 1600-5767
Publisher:
International Union of Crystallography
Research Org:
Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II)
Sponsoring Org:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 47 OTHER INSTRUMENTATION; spherical analyzers; X-ray emission; spectroscopy; inelastic X-ray scattering; X-ray; optics; quartz crystals
OSTI Identifier:
1340372