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Title: In situ X-ray-based imaging of nano materials

Abstract

We study functional nanomaterials that are heterogeneous and understanding their behavior during synthesis and operation requires high resolution diagnostic imaging tools that can be used in situ. Over the past decade, huge progress has been made in the development of X-ray based imaging, including full field and scanning microscopy and their analogs in coherent diffractive imaging. Currently, spatial resolution of about 10 nm and time resolution of sub-seconds are achievable. For catalysis, X-ray imaging allows tracking of particle chemistry under reaction conditions. In energy storage, in situ X-ray imaging of electrode particles is providing important insight into degradation processes. Recently, both spatial and temporal resolutions are improving to a few nm and milliseconds and these developments will open up unprecedented opportunities.

Authors:
 [1];  [2];  [1]
  1. SLAC National Accelerator Lab., Menlo Park, CA (United States). Stanford Synchrotron Radiation Lightsource
  2. Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source II
Publication Date:
Research Org.:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1340351
Alternate Identifier(s):
OSTI ID: 1342406
Report Number(s):
BNL-112070-2016-JA
Journal ID: ISSN 2211-3398
Grant/Contract Number:  
SC00112704; AC02-76SF00515
Resource Type:
Accepted Manuscript
Journal Name:
Current Opinion in Chemical Engineering
Additional Journal Information:
Journal Volume: 12; Journal Issue: C; Journal ID: ISSN 2211-3398
Publisher:
Elsevier
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Weker, Johanna Nelson, Huang, Xiaojing, and Toney, Michael F. In situ X-ray-based imaging of nano materials. United States: N. p., 2016. Web. doi:10.1016/j.coche.2016.01.006.
Weker, Johanna Nelson, Huang, Xiaojing, & Toney, Michael F. In situ X-ray-based imaging of nano materials. United States. doi:10.1016/j.coche.2016.01.006.
Weker, Johanna Nelson, Huang, Xiaojing, and Toney, Michael F. Sat . "In situ X-ray-based imaging of nano materials". United States. doi:10.1016/j.coche.2016.01.006. https://www.osti.gov/servlets/purl/1340351.
@article{osti_1340351,
title = {In situ X-ray-based imaging of nano materials},
author = {Weker, Johanna Nelson and Huang, Xiaojing and Toney, Michael F.},
abstractNote = {We study functional nanomaterials that are heterogeneous and understanding their behavior during synthesis and operation requires high resolution diagnostic imaging tools that can be used in situ. Over the past decade, huge progress has been made in the development of X-ray based imaging, including full field and scanning microscopy and their analogs in coherent diffractive imaging. Currently, spatial resolution of about 10 nm and time resolution of sub-seconds are achievable. For catalysis, X-ray imaging allows tracking of particle chemistry under reaction conditions. In energy storage, in situ X-ray imaging of electrode particles is providing important insight into degradation processes. Recently, both spatial and temporal resolutions are improving to a few nm and milliseconds and these developments will open up unprecedented opportunities.},
doi = {10.1016/j.coche.2016.01.006},
journal = {Current Opinion in Chemical Engineering},
number = C,
volume = 12,
place = {United States},
year = {2016},
month = {2}
}

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