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Title: Discrimination and quantification of Fe and Ni abundances in Genesis solar wind implanted collectors using X-ray standing wave fluorescence yield depth profiling with internal referencing

In this paper, X-ray standing wave fluorescence yield depth profiling was used to determine the solar wind implanted Fe and Ni fluences in a silicon-on-sapphire (SoS) Genesis collector (60326). An internal reference standardization method was developed based on fluorescence from Si and Al in the collector materials. Measured Fe fluence agreed well with that measured previously by us on a sapphire collector (50722) as well as SIMS results by Jurewicz et al. Measured Ni fluence was higher than expected by a factor of two; neither instrumental errors nor solar wind fractionation effects are considered significant perturbations to this value. Impurity Ni within the epitaxial Si layer, if present, could explain the high Ni fluences and therefore needs further investigation. As they stand, these results are consistent with minor temporally-variable Fe and Ni fractionation on the timescale of a year.
Authors:
 [1] ;  [2] ;  [3] ; ORCiD logo [2] ;  [4] ;  [5] ;  [6]
  1. Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
  2. Univ. of Chicago, Argonne, IL (United States); Univ. of Chicago, Chicago, IL (United States)
  3. Univ. of Chicago, Chicago, IL (United States)
  4. Loyola Univ., Chicago, IL (United States)
  5. Univ. of Illinois, Chicago, IL (United States)
  6. California Inst. of Technology (CalTech), Pasadena, CA (United States)
Publication Date:
Grant/Contract Number:
AC02-06CH11357; FG02-94ER14466
Type:
Accepted Manuscript
Journal Name:
Chemical Geology
Additional Journal Information:
Journal Volume: 441; Journal Issue: C; Journal ID: ISSN 0009-2541
Publisher:
Elsevier
Research Org:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org:
National Science Foundation (NSF); USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22); National Aeronautic and Space Administration (NASA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; depth profile modeling; Genesis mission; implant quantification; solar wind fluence; X-ray standing wave analysis
OSTI Identifier:
1340292
Alternate Identifier(s):
OSTI ID: 1398680