Discrimination and quantification of Fe and Ni abundances in Genesis solar wind implanted collectors using X-ray standing wave fluorescence yield depth profiling with internal referencing
Abstract
In this paper, X-ray standing wave fluorescence yield depth profiling was used to determine the solar wind implanted Fe and Ni fluences in a silicon-on-sapphire (SoS) Genesis collector (60326). An internal reference standardization method was developed based on fluorescence from Si and Al in the collector materials. Measured Fe fluence agreed well with that measured previously by us on a sapphire collector (50722) as well as SIMS results by Jurewicz et al. Measured Ni fluence was higher than expected by a factor of two; neither instrumental errors nor solar wind fractionation effects are considered significant perturbations to this value. Impurity Ni within the epitaxial Si layer, if present, could explain the high Ni fluences and therefore needs further investigation. As they stand, these results are consistent with minor temporally-variable Fe and Ni fractionation on the timescale of a year.
- Authors:
-
[2];
- Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
- Univ. of Chicago, Argonne, IL (United States); Univ. of Chicago, Chicago, IL (United States)
- Univ. of Chicago, Chicago, IL (United States)
- Loyola Univ., Chicago, IL (United States)
- Univ. of Illinois, Chicago, IL (United States)
- California Inst. of Technology (CalTech), Pasadena, CA (United States)
- Publication Date:
- Research Org.:
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Sponsoring Org.:
- National Science Foundation (NSF); USDOE Office of Science (SC), Basic Energy Sciences (BES); National Aeronautics and Space Administration (NASA)
- OSTI Identifier:
- 1340292
- Alternate Identifier(s):
- OSTI ID: 1398680
- Grant/Contract Number:
- AC02-06CH11357; FG02-94ER14466
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Chemical Geology
- Additional Journal Information:
- Journal Volume: 441; Journal Issue: C; Journal ID: ISSN 0009-2541
- Publisher:
- Elsevier
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; depth profile modeling; Genesis mission; implant quantification; solar wind fluence; X-ray standing wave analysis
Citation Formats
Choi, Y., Eng, P., Stubbs, J., Sutton, S. R., Schmeling, M., Veryovkin, I. V., and Burnett, D. Discrimination and quantification of Fe and Ni abundances in Genesis solar wind implanted collectors using X-ray standing wave fluorescence yield depth profiling with internal referencing. United States: N. p., 2016.
Web. doi:10.1016/j.chemgeo.2016.08.025.
Choi, Y., Eng, P., Stubbs, J., Sutton, S. R., Schmeling, M., Veryovkin, I. V., & Burnett, D. Discrimination and quantification of Fe and Ni abundances in Genesis solar wind implanted collectors using X-ray standing wave fluorescence yield depth profiling with internal referencing. United States. https://doi.org/10.1016/j.chemgeo.2016.08.025
Choi, Y., Eng, P., Stubbs, J., Sutton, S. R., Schmeling, M., Veryovkin, I. V., and Burnett, D. Sun .
"Discrimination and quantification of Fe and Ni abundances in Genesis solar wind implanted collectors using X-ray standing wave fluorescence yield depth profiling with internal referencing". United States. https://doi.org/10.1016/j.chemgeo.2016.08.025. https://www.osti.gov/servlets/purl/1340292.
@article{osti_1340292,
title = {Discrimination and quantification of Fe and Ni abundances in Genesis solar wind implanted collectors using X-ray standing wave fluorescence yield depth profiling with internal referencing},
author = {Choi, Y. and Eng, P. and Stubbs, J. and Sutton, S. R. and Schmeling, M. and Veryovkin, I. V. and Burnett, D.},
abstractNote = {In this paper, X-ray standing wave fluorescence yield depth profiling was used to determine the solar wind implanted Fe and Ni fluences in a silicon-on-sapphire (SoS) Genesis collector (60326). An internal reference standardization method was developed based on fluorescence from Si and Al in the collector materials. Measured Fe fluence agreed well with that measured previously by us on a sapphire collector (50722) as well as SIMS results by Jurewicz et al. Measured Ni fluence was higher than expected by a factor of two; neither instrumental errors nor solar wind fractionation effects are considered significant perturbations to this value. Impurity Ni within the epitaxial Si layer, if present, could explain the high Ni fluences and therefore needs further investigation. As they stand, these results are consistent with minor temporally-variable Fe and Ni fractionation on the timescale of a year.},
doi = {10.1016/j.chemgeo.2016.08.025},
journal = {Chemical Geology},
number = C,
volume = 441,
place = {United States},
year = {Sun Aug 21 00:00:00 EDT 2016},
month = {Sun Aug 21 00:00:00 EDT 2016}
}
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Works referencing / citing this record:
The future of Genesis science
journal, February 2019
- Burnett, D. S.; Jurewicz, A. J. G.; Woolum, D. S.
- Meteoritics & Planetary Science, Vol. 54, Issue 5