skip to main content


Title: Determination of residual stress in a microtextured α titanium component using high-energy synchrotron X-rays

A shrink-fit sample is manufactured with a Ti-8Al-1Mo-1V alloy to introduce a multiaxial residual stress field in the disk of the sample. A set of strain and orientation pole figures are measured at various locations across the disk using synchrotron high-energy X-ray diffraction. Two approaches—the traditional sin 2Ψ method and the bi-scale optimization method—are taken to determine the stresses in the disk based on the measured strain and orientation pole figures, to explore the range of solutions that are possible for the stress field within the disk. While the stress components computed using the sin 2Ψ method and the bi-scale optimization method have similar trends, their magnitudes are significantly different. Lastly, it is suspected that the local texture variation in the material is the cause of this discrepancy.
 [1] ;  [2] ;  [3] ;  [4] ;  [3]
  1. Argonne National Lab. (ANL), Lemont, IL (United States)
  2. McMaster Univ., Hamilton, ON (Canada)
  3. Cornell Univ., Ithaca, NY (United States)
  4. Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)
Publication Date:
Grant/Contract Number:
Accepted Manuscript
Journal Name:
Journal of Strain Analysis for Engineering Design
Additional Journal Information:
Journal Volume: 51; Journal Issue: 5; Journal ID: ISSN 0309-3247
Research Org:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org:
US Air Force Office of Scientific Research (AFOSR); USDOE
Country of Publication:
United States
42 ENGINEERING; diffraction; high energy synchrotron x-ray; lattice strain; multi-scale; residual stress; titanium alloy
OSTI Identifier: