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Title: Diffraction imaging for in situ characterization of double-crystal X-ray monochromators

In this paper, imaging of the Bragg-reflected X-ray beam is proposed and validated as an in situ method for characterization of the performance of double-crystal monochromators under the heat load of intense synchrotron radiation. A sequence of images is collected at different angular positions on the reflectivity curve of the second crystal and analyzed. The method provides rapid evaluation of the wavefront of the exit beam, which relates to local misorientation of the crystal planes along the beam footprint on the thermally distorted first crystal. The measured misorientation can be directly compared with the results of finite element analysis. Finally, the imaging method offers an additional insight into the local intrinsic crystal quality over the footprint of the incident X-ray beam.
Authors:
 [1] ;  [1] ;  [1] ;  [1] ;  [2]
  1. Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source
  2. Univ. of Chicago, IL (United States). Center for Advanced Radiation Sources (CARS)
Publication Date:
Grant/Contract Number:
AC02-06CH11357
Type:
Accepted Manuscript
Journal Name:
Journal of Applied Crystallography (Online)
Additional Journal Information:
Journal Name: Journal of Applied Crystallography (Online); Journal Volume: 48; Journal Issue: 6; Journal ID: ISSN 1600-5767
Publisher:
International Union of Crystallography
Research Org:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
Contributing Orgs:
Univ. of Chicago, IL (United States)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; X-ray monochromators; thermal deformation; cryogenic cooling; diffraction imaging; high heat loads; in situ metrology; rocking curves
OSTI Identifier:
1339259