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Title: Fundamental aspects of electric double layer force-distance measurements at liquid-solid interfaces using atomic force microscopy

Abstract

In this paper, atomic force microscopy (AFM) force-distance measurements are used to investigate the layered ion structure of Ionic Liquids (ILs) at the mica surface. The effects of various tip properties on the measured force profiles are examined and reveal that the measured ion position is independent of tip properties, while the tip radius affects the forces required to break through the ion layers as well as the adhesion force. Force data is collected for different ILs and directly compared with interfacial ion density profiles predicted by molecular dynamics. Through this comparison it is concluded that AFM force measurements are sensitive to the position of the ion with the larger volume and mass, suggesting that ion selectivity in force-distance measurements are related to excluded volume effects and not to electrostatic or chemical interactions between ions and AFM tip. Finally, the comparison also revealed that at distances greater than 1 nm the system maintains overall electroneutrality between the AFM tip and sample, while at smaller distances other forces (e.g., van der waals interactions) dominate and electroneutrality is no longer maintained.

Authors:
 [1];  [2];  [3];  [1];  [2];  [1];  [3];  [4];  [1];  [2];  [1]
  1. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Science (CNMS)
  2. Huazhong University of Science and Technology (HUST), Wuhan (China). State Key Laboratory of Coal Combustion, School of Energy and Power Engineering
  3. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Chemical Sciences Division
  4. Vanderbilt University, Nashville, TN (United States). Department of Chemical &Biomolecular Engineering and Multiscale Modeling and Simulation Center
Publication Date:
Research Org.:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
1338532
Grant/Contract Number:  
AC05-00OR22725; AC02-05CH11231
Resource Type:
Accepted Manuscript
Journal Name:
Scientific Reports
Additional Journal Information:
Journal Volume: 6; Journal ID: ISSN 2045-2322
Publisher:
Nature Publishing Group
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY; 25 ENERGY STORAGE

Citation Formats

Black, Jennifer M., Zhu, Mengyang, Zhang, Pengfei, Unocic, Raymond R., Guo, Daqiang, Okatan, M. Baris, Dai, Sheng, Cummings, Peter T., Kalinin, Sergei V., Feng, Guang, and Balke, Nina. Fundamental aspects of electric double layer force-distance measurements at liquid-solid interfaces using atomic force microscopy. United States: N. p., 2016. Web. doi:10.1038/srep32389.
Black, Jennifer M., Zhu, Mengyang, Zhang, Pengfei, Unocic, Raymond R., Guo, Daqiang, Okatan, M. Baris, Dai, Sheng, Cummings, Peter T., Kalinin, Sergei V., Feng, Guang, & Balke, Nina. Fundamental aspects of electric double layer force-distance measurements at liquid-solid interfaces using atomic force microscopy. United States. doi:10.1038/srep32389.
Black, Jennifer M., Zhu, Mengyang, Zhang, Pengfei, Unocic, Raymond R., Guo, Daqiang, Okatan, M. Baris, Dai, Sheng, Cummings, Peter T., Kalinin, Sergei V., Feng, Guang, and Balke, Nina. Fri . "Fundamental aspects of electric double layer force-distance measurements at liquid-solid interfaces using atomic force microscopy". United States. doi:10.1038/srep32389. https://www.osti.gov/servlets/purl/1338532.
@article{osti_1338532,
title = {Fundamental aspects of electric double layer force-distance measurements at liquid-solid interfaces using atomic force microscopy},
author = {Black, Jennifer M. and Zhu, Mengyang and Zhang, Pengfei and Unocic, Raymond R. and Guo, Daqiang and Okatan, M. Baris and Dai, Sheng and Cummings, Peter T. and Kalinin, Sergei V. and Feng, Guang and Balke, Nina},
abstractNote = {In this paper, atomic force microscopy (AFM) force-distance measurements are used to investigate the layered ion structure of Ionic Liquids (ILs) at the mica surface. The effects of various tip properties on the measured force profiles are examined and reveal that the measured ion position is independent of tip properties, while the tip radius affects the forces required to break through the ion layers as well as the adhesion force. Force data is collected for different ILs and directly compared with interfacial ion density profiles predicted by molecular dynamics. Through this comparison it is concluded that AFM force measurements are sensitive to the position of the ion with the larger volume and mass, suggesting that ion selectivity in force-distance measurements are related to excluded volume effects and not to electrostatic or chemical interactions between ions and AFM tip. Finally, the comparison also revealed that at distances greater than 1 nm the system maintains overall electroneutrality between the AFM tip and sample, while at smaller distances other forces (e.g., van der waals interactions) dominate and electroneutrality is no longer maintained.},
doi = {10.1038/srep32389},
journal = {Scientific Reports},
number = ,
volume = 6,
place = {United States},
year = {2016},
month = {9}
}

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