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Title: Analyzing the effectiveness of a frame-level redundancy scrubbing technique for SRAM-based FPGAs

Radiation effects such as soft errors are the major threat to the reliability of SRAM-based FPGAs. This work analyzes the effectiveness in correcting soft errors of a novel scrubbing technique using internal frame redundancy called Frame-level Redundancy Scrubbing (FLR-scrubbing). This correction technique can be implemented in a coarse grain TMR design. The FLR-scrubbing technique was implemented on a mid-size Xilinx Virtex-5 FPGA device used as a case study. The FLR-scrubbing technique was tested under neutron radiation and fault injection. Implementation results demonstrated minimum area and energy consumption overhead when compared to other techniques. The time to repair the fault is also improved by using the Internal Configuration Access Port (ICAP). Lastly, neutron radiation test results demonstrated that the proposed technique is suitable for correcting accumulated SEUs and MBUs.
Authors:
 [1] ;  [1] ;  [1] ;  [1] ;  [2]
  1. PGMICRO, UFRGS, Porto Alegre (Brazil)
  2. Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
Publication Date:
Report Number(s):
LA-UR-15-27806
Journal ID: ISSN 0018-9499
Grant/Contract Number:
AC52-06NA25396
Type:
Accepted Manuscript
Journal Name:
IEEE Transactions on Nuclear Science
Additional Journal Information:
Journal Volume: 62; Journal Issue: 6; Journal ID: ISSN 0018-9499
Publisher:
Institute of Electrical and Electronics Engineers (IEEE)
Research Org:
Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
Subject:
73 NUCLEAR PHYSICS AND RADIATION PHYSICS; radiation effects; fault tolerance; field programmable gate arrays
OSTI Identifier:
1334144