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Title: A new method to reduce the statistical and systematic uncertainty of chance coincidence backgrounds measured with waveform digitizers

We present a new method for measuring chance-coincidence backgrounds during the collection of coincidence data. The method relies on acquiring data with near-zero dead time, which is now realistic due to the increasing deployment of flash electronic-digitizer (waveform digitizer) techniques. An experiment designed to use this new method is capable of acquiring more coincidence data, and a much reduced statistical fluctuation of the measured background. A statistical analysis is presented, and us ed to derive a figure of merit for the new method. Factors of four improvement over other analyses are realistic. The technique is illustrated with preliminary data taken as part of a program to make new measurements of the prompt fission neutron spectra at Los Alamo s Neutron Science Center. In conclusion, it is expected that the these measurements will occur in a regime where the maximum figure of merit will be exploited
Authors:
 [1]
  1. Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
Publication Date:
Report Number(s):
LA-UR-15-23405
Journal ID: ISSN 0168-9002
Grant/Contract Number:
AC52-06NA25396
Type:
Accepted Manuscript
Journal Name:
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Additional Journal Information:
Journal Volume: 805; Journal ID: ISSN 0168-9002
Publisher:
Elsevier
Research Org:
Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; Chance coincidence background; Waveform digitizer; Statistical uncertainty; Systematic uncertainty
OSTI Identifier:
1334114