Understanding the Rocksalt-to-Wurtzite phase transformation through microstructural analysis of (Al,Sc)N epitaxial thin films
- Authors:
-
- Department of Materials Science and Engineering, University of California, Berkeley, California 94720, USA
- School of Materials Engineering, Purdue University, West Lafayette, Indiana 47907, USA, Birck Nanotechnology Center, Purdue University, West Lafayette, Indiana 47907, USA
- Center for Functional Nanomaterials, Brookhaven National Laboratory, Upton, New York 11973-5000, USA
- Bradley Department of Electrical and Computer Engineering and Department of Materials Science and Engineering, Virginia Tech, Blacksburg, Virginia 24061, USA
- Publication Date:
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1330120
- Grant/Contract Number:
- CBET-1048616; AC02-98CH10886
- Resource Type:
- Publisher's Accepted Manuscript
- Journal Name:
- Applied Physics Letters
- Additional Journal Information:
- Journal Name: Applied Physics Letters Journal Volume: 109 Journal Issue: 17; Journal ID: ISSN 0003-6951
- Publisher:
- American Institute of Physics
- Country of Publication:
- United States
- Language:
- English
Citation Formats
Saha, Bivas, Saber, Sammy, Stach, Eric A., Kvam, Eric P., and Sands, Timothy D. Understanding the Rocksalt-to-Wurtzite phase transformation through microstructural analysis of (Al,Sc)N epitaxial thin films. United States: N. p., 2016.
Web. doi:10.1063/1.4966278.
Saha, Bivas, Saber, Sammy, Stach, Eric A., Kvam, Eric P., & Sands, Timothy D. Understanding the Rocksalt-to-Wurtzite phase transformation through microstructural analysis of (Al,Sc)N epitaxial thin films. United States. https://doi.org/10.1063/1.4966278
Saha, Bivas, Saber, Sammy, Stach, Eric A., Kvam, Eric P., and Sands, Timothy D. Wed .
"Understanding the Rocksalt-to-Wurtzite phase transformation through microstructural analysis of (Al,Sc)N epitaxial thin films". United States. https://doi.org/10.1063/1.4966278.
@article{osti_1330120,
title = {Understanding the Rocksalt-to-Wurtzite phase transformation through microstructural analysis of (Al,Sc)N epitaxial thin films},
author = {Saha, Bivas and Saber, Sammy and Stach, Eric A. and Kvam, Eric P. and Sands, Timothy D.},
abstractNote = {},
doi = {10.1063/1.4966278},
journal = {Applied Physics Letters},
number = 17,
volume = 109,
place = {United States},
year = {Wed Oct 26 00:00:00 EDT 2016},
month = {Wed Oct 26 00:00:00 EDT 2016}
}
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https://doi.org/10.1063/1.4966278
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