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Title: Origin and Reduction of 1 / f Magnetic Flux Noise in Superconducting Devices

Authors:
; ; ; ; ; ; ; ; ;
Publication Date:
Grant/Contract Number:
FG02-05ER46237; DEAC02-06CH11357
Type:
Publisher's Accepted Manuscript
Journal Name:
Physical Review Applied
Additional Journal Information:
Journal Name: Physical Review Applied Journal Volume: 6 Journal Issue: 4; Journal ID: ISSN 2331-7019
Publisher:
American Physical Society
Sponsoring Org:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
Country of Publication:
United States
Language:
English
OSTI Identifier:
1329274

Kumar, P., Sendelbach, S., Beck, M. A., Freeland, J. W., Wang, Zhe, Wang, Hui, Yu, Clare C., Wu, R. Q., Pappas, D. P., and McDermott, R.. Origin and Reduction of 1 / f Magnetic Flux Noise in Superconducting Devices. United States: N. p., Web. doi:10.1103/PhysRevApplied.6.041001.
Kumar, P., Sendelbach, S., Beck, M. A., Freeland, J. W., Wang, Zhe, Wang, Hui, Yu, Clare C., Wu, R. Q., Pappas, D. P., & McDermott, R.. Origin and Reduction of 1 / f Magnetic Flux Noise in Superconducting Devices. United States. doi:10.1103/PhysRevApplied.6.041001.
Kumar, P., Sendelbach, S., Beck, M. A., Freeland, J. W., Wang, Zhe, Wang, Hui, Yu, Clare C., Wu, R. Q., Pappas, D. P., and McDermott, R.. 2016. "Origin and Reduction of 1 / f Magnetic Flux Noise in Superconducting Devices". United States. doi:10.1103/PhysRevApplied.6.041001.
@article{osti_1329274,
title = {Origin and Reduction of 1 / f Magnetic Flux Noise in Superconducting Devices},
author = {Kumar, P. and Sendelbach, S. and Beck, M. A. and Freeland, J. W. and Wang, Zhe and Wang, Hui and Yu, Clare C. and Wu, R. Q. and Pappas, D. P. and McDermott, R.},
abstractNote = {},
doi = {10.1103/PhysRevApplied.6.041001},
journal = {Physical Review Applied},
number = 4,
volume = 6,
place = {United States},
year = {2016},
month = {10}
}

Works referenced in this record:

Generalized Gradient Approximation Made Simple
journal, October 1996
  • Perdew, John P.; Burke, Kieron; Ernzerhof, Matthias
  • Physical Review Letters, Vol. 77, Issue 18, p. 3865-3868
  • DOI: 10.1103/PhysRevLett.77.3865