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Title: Big, Deep, and Smart Data in Scanning Probe Microscopy

Scanning probe microscopy techniques open the door to nanoscience and nanotechnology by enabling imaging and manipulation of structure and functionality of matter on nanometer and atomic scales. We analyze the discovery process by SPM in terms of information flow from tip-surface junction to the knowledge adoption by scientific community. Furthermore, we discuss the challenges and opportunities offered by merging of SPM and advanced data mining, visual analytics, and knowledge discovery technologies.
Authors:
 [1] ;  [1] ;  [1] ;  [1] ;  [1] ;  [2] ;  [2] ;  [3] ;  [4] ;  [1] ;  [1]
  1. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Inst. for Functional Imaging of Materials and the Center for Nanophase Materials Science
  2. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Inst. for Functional Imaging of Materials and Computer Science and Mathematics Division
  3. Drexel Univ., Philadelphia, PA (United States). College of Computing and Informatics
  4. Asylum Reserch and Oxford Instruments Company, Santa Barbara, CA (United States)
Publication Date:
Grant/Contract Number:
AC05-00OR22725
Type:
Accepted Manuscript
Journal Name:
ACS Nano
Additional Journal Information:
Journal Name: ACS Nano; Journal ID: ISSN 1936-0851
Publisher:
American Chemical Society
Research Org:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
Sponsoring Org:
USDOE Office of Science (SC)
Country of Publication:
United States
Language:
English
Subject:
77 NANOSCIENCE AND NANOTECHNOLOGY
OSTI Identifier:
1327600

Kalinin, Sergei V., Strelcov, Evgheni, Belianinov, Alex, Somnath, Suhas, Vasudevan, Rama K., Lingerfelt, Eric J., Archibald, Richard K., Chen, Chaomei, Proksch, Roger, Laanait, Nouamane, and Jesse, Stephen. Big, Deep, and Smart Data in Scanning Probe Microscopy. United States: N. p., Web. doi:10.1021/acsnano.6b04212.
Kalinin, Sergei V., Strelcov, Evgheni, Belianinov, Alex, Somnath, Suhas, Vasudevan, Rama K., Lingerfelt, Eric J., Archibald, Richard K., Chen, Chaomei, Proksch, Roger, Laanait, Nouamane, & Jesse, Stephen. Big, Deep, and Smart Data in Scanning Probe Microscopy. United States. doi:10.1021/acsnano.6b04212.
Kalinin, Sergei V., Strelcov, Evgheni, Belianinov, Alex, Somnath, Suhas, Vasudevan, Rama K., Lingerfelt, Eric J., Archibald, Richard K., Chen, Chaomei, Proksch, Roger, Laanait, Nouamane, and Jesse, Stephen. 2016. "Big, Deep, and Smart Data in Scanning Probe Microscopy". United States. doi:10.1021/acsnano.6b04212. https://www.osti.gov/servlets/purl/1327600.
@article{osti_1327600,
title = {Big, Deep, and Smart Data in Scanning Probe Microscopy},
author = {Kalinin, Sergei V. and Strelcov, Evgheni and Belianinov, Alex and Somnath, Suhas and Vasudevan, Rama K. and Lingerfelt, Eric J. and Archibald, Richard K. and Chen, Chaomei and Proksch, Roger and Laanait, Nouamane and Jesse, Stephen},
abstractNote = {Scanning probe microscopy techniques open the door to nanoscience and nanotechnology by enabling imaging and manipulation of structure and functionality of matter on nanometer and atomic scales. We analyze the discovery process by SPM in terms of information flow from tip-surface junction to the knowledge adoption by scientific community. Furthermore, we discuss the challenges and opportunities offered by merging of SPM and advanced data mining, visual analytics, and knowledge discovery technologies.},
doi = {10.1021/acsnano.6b04212},
journal = {ACS Nano},
number = ,
volume = ,
place = {United States},
year = {2016},
month = {9}
}